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参数资料
| 型号： | CAT34AC02RE-1.8TE13 |
| 英文描述： | 2K-Bit SMBus EEPROM for ACR Card Configuration |
| 中文描述： | 的2K位的SMBus对于ACR卡的EEPROM配置 |
| 文件页数： | 2/10页 |
| 文件大小： | 68K |
| 代理商： | CAT34AC02RE-1.8TE13 |
CAT34AC02
2
Doc. No. 1025, Rev. E
D.C. OPERATING CHARACTERISTICS
V
CC
= +1.8V to +6.0V, unless otherwise specified.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
I
CC
Power Supply Current (Read)
f
SCL
= 100 kHz
1
mA
I
CC
I
SB(5)
Power Supply Current (Write)
f
SCL
= 100 kHz
3
mA
Standby Current (V
CC
= 5.0V)
V
IN
= GND or V
CC
0
μ
A
μ
A
μ
A
V
I
LI
Input Leakage Current
V
IN
= GND to V
CC
10
I
LO
Output Leakage Current
V
OUT
= GND to V
CC
10
V
IL
Input Low Voltage
–
1
V
CC
x 0.3
V
IH
Input High Voltage
V
CC
x 0.7
V
CC
+ 0.5
V
V
OL1
Output Low Voltage (V
CC
= 3.0V)
I
OL
= 3 mA
0.4
V
V
OL2
Output Low Voltage (V
CC
= 1.8V)
I
OL
= 1.5 mA
0.5
V
CAPACITANCE
T
A
= 25
°
C, f = 1.0 MHz, V
CC
= 5V
Symbol
Parameter
C
I/O(3)
Input/Output Capacitance (SDA)
C
IN(3)
Input Capacitance (A0, A1, A2, SCL)
Test Conditions
Min
Typ
Max
Units
V
I/O
= 0V
8
pF
V
IN
= 0V
6
pF
RELIABILITY CHARACTERISTICS
Symbol
N
END(3)
T
DR(3)
V
ZAP(3)
I
LTH(3)(4)
Parameter
Reference Test Method
Min
Typ
Max
Units
Endurance
MIL-STD-883, Test Method 1033 1,000,000
Cycles/Byte
Data Retention
MIL-STD-883, Test Method 1008
100
Years
ESD Susceptibility
MIL-STD-883, Test Method 3015
2000
Volts
Latch-up
JEDEC Standard 17
100
mA
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias
Storage Temperature.......................
–
65
°
C to +150
°
C
Voltage on Any Pin with
Respect to Ground
(1)
...........
–
2.0V to +V
CC
+ 2.0V
V
CC
with Respect to Ground ...............
–
2.0V to +7.0V
Package Power Dissipation
Capability (T
A
= 25
°
C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300
°
C
Output Short Circuit Current
(2)
........................ 100mA
–
55
°
C to +125
°
C
*COMMENT
Stresses above those listed under
“
Absolute Maximum
Ratings
”
may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
Note:
(1) The minimum DC input voltage is
–
0.5V. During transitions, inputs may undershoot to
–
2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V
CC
+0.5V, which may overshoot to V
CC
+ 2.0V for periods of less than 20ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from
–
1V to V
CC
+1V.
(5) Standby Current (I
SB
) = 0
μ
A (<900nA).
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相关代理商/技术参数 |
参数描述 |
|---|---|
| CAT34AC02RE-TE13 | 制造商:CATALYST 制造商全称:Catalyst Semiconductor 功能描述:2K-Bit SMBus EEPROM for ACR Card Configuration |
| CAT34AC02RI | 制造商:CATALYST 制造商全称:Catalyst Semiconductor 功能描述:2K-Bit SMBus EEPROM for ACR Card Configuration |
| CAT34AC02RI-1.8 | 制造商:CATALYST 制造商全称:Catalyst Semiconductor 功能描述:2K-Bit SMBus EEPROM for ACR Card Configuration |
| CAT34AC02RI-1.8TE13 | 制造商:CATALYST 制造商全称:Catalyst Semiconductor 功能描述:2K-Bit SMBus EEPROM for ACR Card Configuration |
| CAT34AC02RI-TE13 | 制造商:CATALYST 制造商全称:Catalyst Semiconductor 功能描述:2K-Bit SMBus EEPROM for ACR Card Configuration |
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