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参数资料
| 型号： | CY7C1371BV25-83BGC |
| 厂商： | CYPRESS SEMICONDUCTOR CORP |
| 元件分类： | SRAM |
| 英文描述： | 512K X 36 ZBT SRAM, 10 ns, PBGA119 |
| 封装： | 14 X 22 MM, 2.40 MM HEIGHT, PLASTIC, BGA-119 |
| 文件页数： | 2/25页 |
| 文件大小： | 709K |
| 代理商： | CY7C1371BV25-83BGC |
CY7C1373BV25
CY7C1371BV25
Document #: 38-05250 Rev. *A
Page 10 of 25
controller enters the Shift-DR state. The IDCODE instruction
is loaded into the instruction register upon power-up or
whenever the TAP controller is given a test logic reset state.
SAMPLE Z
The SAMPLE Z instruction causes the boundary scan register
to be connected between the TDI and TDO pins when the TAP
controller is in a Shift-DR state. It also places all SRAM outputs
into a High-Z state.
SAMPLE/PRELOAD
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. The
PRELOAD portion of this instruction is not implemented, so
the TAP controller is not fully 1149.1 compliant.
When the SAMPLE/PRELOAD instructions loaded into the
instruction register and the TAP controller in the Capture-DR
state, a snapshot of data on the inputs and output pins is
captured in the boundary scan register.
The user must be aware that the TAP controller clock can only
operate at a frequency up to 10 MHz, while the SRAM clock
operates more than an order of magnitude faster. Because
there is a large difference in the clock frequencies, it is
possible that during the Capture-DR state, an input or output
will undergo a transition. The TAP may then try to capture a
signal while in transition (metastable state). This will not harm
the device, but there is no guarantee as to the value that will
be captured. Repeatable results may not be possible.
To guarantee that the boundary scan register will capture the
correct value of a signal, the SRAM signal must be stabilized
long enough to meet the TAP controller’s capture set-up plus
hold times (TCS and TCH). The SRAM clock input might not
be captured correctly if there is no way in a design to stop (or
slow) the clock during a SAMPLE / PRELOAD instruction. If
this is an issue, it is still possible to capture all other signals
and simply ignore the value of the CK and CK# captured in the
boundary scan register.
Once the data is captured, it is possible to shift out the data by
putting the TAP into the Shift-DR state. This places the
boundary scan register between the TDI and TDO pins.
Note that since the PRELOAD part of the command is not
implemented, putting the TAP into the Update to the
Update-DR state while performing a SAMPLE / PRELOAD
instruction will have the same effect as the Pause-DR
command.
Bypass
When the BYPASS instruction is loaded in the instruction
register and the TAP is placed in a Shift-DR state, the bypass
register is placed between the TDI and TDO pins. The
advantage of the BYPASS instruction is that it shortens the
boundary scan path when multiple devices are connected
together on a board.
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
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相关代理商/技术参数 |
参数描述 |
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| CY7C1371C-100AC | 功能描述:IC SRAM 18MBIT 100MHZ 100LQFP RoHS:否 类别:集成电路 (IC) >> 存储器 系列:- 标准包装:96 系列:- 格式 - 存储器:闪存 存储器类型:FLASH 存储容量:16M（2M x 8，1M x 16） 速度:70ns 接口:并联 电源电压:2.65 V ~ 3.6 V 工作温度:-40°C ~ 85°C 封装/外壳:48-TFSOP（0.724"，18.40mm 宽） 供应商设备封装:48-TSOP 包装:托盘 |
| CY7C1371C-100AIT | 制造商:Cypress Semiconductor 功能描述:SRAM Chip Sync Quad 3.3V 18M-Bit 512K x 36 8.5ns 100-Pin TQFP T/R |
| CY7C1371C-100BZC | 制造商:Rochester Electronics LLC 功能描述:16MB (512KX36) 3.3V NOBL-FT SRAM - Bulk 制造商:Cypress Semiconductor 功能描述: |
| CY7C1371C-117BGC | 制造商:Cypress Semiconductor 功能描述:SRAM Chip Sync Quad 3.3V 18M-Bit 512K x 36 7.5ns 119-Pin BGA 制造商:Cypress Semiconductor 功能描述:SRAM Chip Sync Single 3.3V 18M-Bit 512K x 36 7.5ns 119-Pin BGA 制造商:Rochester Electronics LLC 功能描述:16MB (512KX36) 3.3V NOBL-FT SRAM - Bulk |
| CY7C1371C-133BGC | 制造商:Rochester Electronics LLC 功能描述:16MB (512KX36) 3.3V NOBL-FT SRAM - Bulk 制造商:Cypress Semiconductor 功能描述: |
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