集成电路 (IC) SN74LS31DRE4品牌、价格、PDF参数

SN74LS31DRE4 • 品牌、价格
元器件型号 厂商 描述 数量 价格
SN74LS31DRE4 Texas Instruments IC HEX DELAY ELEMENT 16-SOIC 0
SN74LS283DRE4 Texas Instruments IC BIN FULL 4BIT ADD CAR 16-SOIC 0
SN74ACT1284PWE4 Texas Instruments IC 7BIT BUS INTERFC 3ST 20-TSSOP 0
SN74ABT8952DLR Texas Instruments IC SCAN TESST DEVICE 28-SSOP 0
SN74ABT8652DWRE4 Texas Instruments IC SCAN TEST DEVICE 28-SOIC 0
SN74ABT8652DLRG4 Texas Instruments IC SCAN TEST DEVICE 28-SSOP 0
SN74ABT8652DLR Texas Instruments IC SCAN TEST DEVICE 28-SSOP 0
SN74ABT8646DWRE4 Texas Instruments IC SCAN TEST DEVICE 28-SOIC 0
SN74ABT8646DWR Texas Instruments IC SCAN TEST DEVICE 28-SOIC 0
SN74ABT8543DWRE4 Texas Instruments IC SCAN TEST DEVICE 28-SOIC 0
SN74ABT8543DWR Texas Instruments IC SCAN TEST DEVICE 28-SOIC 0
SN74ABT18640DLRG4 Texas Instruments IC SCAN TEST DEVICE 18BIT 56SSOP 0
SN74ABT18504PMRG4 Texas Instruments IC SCAN TEST DEVICE 20BIT 64LQFP 0
SN74ABT18504PMR Texas Instruments IC SCAN TEST DEVICE 20BIT 64LQFP 0
SN74BCT8374ANTE4 Texas Instruments IC SCAN TEST DEVICE W/FF 24-DIP 0
SN74BCT8374ADWRE4 Texas Instruments IC SCAN TEST DEVICE W/FF 24-SOIC 0
SN74BCT8373ADWRE4 Texas Instruments IC SCAN TEST DEVICE LATCH 24SOIC 0
SN74BCT8245ANTE4 Texas Instruments IC SCAN TEST DEVICE TXRX 24-DIP 0
SN74BCT8240ANTE4 Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 0
SN74BCT8240ADWRE4 Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC 0
SN74BCT29854DWRE4 Texas Instruments IC TRANSCEIVER 1-9BIT 24SOIC 0
SN74BCT29854DWE4 Texas Instruments IC TRANSCEIVER 1-9BIT 24SOIC 0
SN74AS181ANTE4 Texas Instruments IC ARITHMETIC LOGIC UNIT 24-PDIP 0
SN74AS181ADWRE4 Texas Instruments IC ARITHMETIC LOGIC UNIT 24-SOIC 0
SN74AS181ADWR Texas Instruments IC ARITHMETIC LOGIC UNIT 24-SOIC 0
SN74AS181ADWE4 Texas Instruments IC ARITHMETIC LOGIC UNIT 24-SOIC 0
SN74LS31DRE4 • PDF参数
类别: 集成电路 (IC)
逻辑类型: 延迟元件
电源电压: 4.75 V ~ 5.25 V
位数: 6
工作温度: 0°C ~ 70°C
安装类型: 表面贴装
封装/外壳: 16-SOIC(0.154",3.90mm 宽)
供应商设备封装: 16-SOIC N
包装: 带卷 (TR)