| 元器件型号 | 厂商 | 描述 | 数量 | 价格 |
|---|---|---|---|---|
| 74LVTH182646APMG4 | Texas Instruments | IC 18BIT TXRX REGISTER 64-LQFP | 0 | 1,600:$10.90600 |
| SN74BCT8373ANTE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 0 | 60:$10.04500 |
| SN74BCT8244ANTE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 0 | 60:$10.04500 |
| SN74ABT8646DWG4 | Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 0 | 60:$9.94250 |
| SN74ABT8646DWE4 | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 0 | 60:$9.94250 |
| CLVT8996DWG4 | Texas Instruments | IC 10-BIT SCAN PORT XCVR 24-SOIC | 0 | 75:$9.22507 |
| SN74BCT8374ADWG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 0 | 75:$8.91747 |
| SN74BCT8373ADWG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 0 | 75:$8.91747 |
| SN74BCT8240ADWG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 0 | 75:$8.91747 |
| SN74BCT8374ADWE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 0 | 75:$8.91747 |
| SN74BCT8373ADWE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 0 | 75:$8.91747 |
| SN74BCT8240ADWE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 0 | 75:$8.91747 |
| SN74SSQEC32882ZALR | Texas Instruments | IC REGSTR BUFF 28-56BIT 176NFBGA | 0 | 1:$13.37000 10:$12.13300 25:$11.25000 100:$10.30750 250:$9.42400 500:$8.77610 |
| SN74SSQEC32882ZALR | Texas Instruments | IC REGSTR BUFF 28-56BIT 176NFBGA | 0 | 1:$13.37000 10:$12.13300 25:$11.25000 100:$10.30750 250:$9.42400 500:$8.77610 |
| SN74SSQEC32882ZALR | Texas Instruments | IC REGSTR BUFF 28-56BIT 176NFBGA | 0 | 1,000:$7.83400 2,000:$7.53900 5,000:$7.30400 10,000:$7.06800 |
| SN74GTLP22034ZQLR | Texas Instruments | IC TXRX ADJ EDGE 8BIT 56-VFBGA | 0 | 1,000:$6.68300 |
| SN74GTLP22033ZQLR | Texas Instruments | IC TXRX ADJ EDGE 8BIT 56-VFBGA | 0 | 1,000:$6.68300 |
| SN74GTLP2034ZQLR | Texas Instruments | IC TXRX ADJ EDGE 8BIT 56-VFBGA | 0 | 1,000:$6.68300 |
| SN74GTLP2033ZQLR | Texas Instruments | IC TXRX ADJ EDGE 8BIT 56-VFBGA | 0 | 1,000:$6.68300 |
| SN74ABT8952DWRE4 | Texas Instruments | IC SCAN TESST DEVICE 28-SOIC | 0 | 1,000:$6.54800 |
| CABT8996DWRG4 | Texas Instruments | IC SCN PRT TAP TXRX 10BIT 24SOIC | 0 | 2,000:$6.40000 |
| 1L8980ADWRG4 | Texas Instruments | IC EMB TEST-BUS CTRLR 24-SOIC | 0 | 2,000:$5.79800 |
| SN74BCT8245ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 0 | 2,000:$5.65500 |
| SN74BCT8244ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24SOIC | 0 | 2,000:$5.65500 |
| SN74BCT8245ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 0 | 2,000:$5.65500 |
| SN74BCT8244ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 0 | 2,000:$5.65500 |
| 74ABT18245ADGGRG4 | Texas Instruments | IC SCAN TEST DEVICE 56TSSOP | 0 | 2,000:$5.59000 |
| SN74LS181NE4 | Texas Instruments | IC ARTHMTC UNIT/FUN GEN 24-DIP | 0 | 105:$5.08752 |
| SN74BCT29854NTE4 | Texas Instruments | IC TRANSCEIVER 1-9BIT 24DIP | 0 | 120:$4.30500 |
| 74LVTH182512DGGRG4 | Texas Instruments | IC SCAN TEST DEVICE 64TSSOP | 0 | 2,000:$4.29000 |
| 类别: | 集成电路 (IC) |
|---|---|
| 逻辑类型: | ABT 扫描测试设备，带收发器和寄存器 |
| 电源电压: | 2.7 V ~ 3.6 V |
| 位数: | 18 |
| 工作温度: | -40°C ~ 85°C |
| 安装类型: | 表面贴装 |
| 封装/外壳: | 64-LQFP |
| 供应商设备封装: | 64-LQFP（10x10） |
| 包装: | 托盘 |