| 元器件型号 | 厂商 | 描述 | 数量 | 价格 |
|---|---|---|---|---|
| SN74ABT8952DWR | Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 634 | 1:$12.51000 10:$11.25200 25:$10.23360 100:$9.26350 250:$8.48752 500:$7.76000 |
| SN74ABT8952DWR | Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 0 | 1,000:$6.54800 2,000:$6.30500 5,000:$6.06300 10,000:$5.96600 25,000:$5.82000 |
| SN74SSTEB32866ZWLR | Texas Instruments | IC BUFF CONFIG REG 25BIT 96BGA | 1,066 | 1:$9.75000 10:$8.77000 25:$7.97600 100:$7.21980 250:$6.61500 500:$6.04800 |
| SN74SSTEB32866ZWLR | Texas Instruments | IC BUFF CONFIG REG 25BIT 96BGA | 1,066 | 1:$9.75000 10:$8.77000 25:$7.97600 100:$7.21980 250:$6.61500 500:$6.04800 |
| SN74SSTEB32866ZWLR | Texas Instruments | IC BUFF CONFIG REG 25BIT 96BGA | 0 | 1,000:$5.10300 2,000:$4.91400 5,000:$4.72500 10,000:$4.64900 25,000:$4.53600 |
| 类别: | 集成电路 (IC) |
|---|---|
| 逻辑类型: | 扫描测试设备，带寄存总线收发器 |
| 电源电压: | 4.5 V ~ 5.5 V |
| 位数: | 8 |
| 工作温度: | -40°C ~ 85°C |
| 安装类型: | 表面贴装 |
| 封装/外壳: | 28-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装: | 28-SOIC |
| 包装: | 剪切带 (CT) |