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| 型号： | MAX3227IDBE4 |
| 厂商： | Texas Instruments |
| 文件页数： | 12/16页 |
| 文件大小： | 0K |
| 描述： | IC RS232 3V5.5V 15KVESD 16-SSOP |
| 标准包装： | 80 |
| 类型： | 收发器 |
| 驱动器/接收器数： | 1/1 |
| 规程： | RS232 |
| 电源电压： | 3 V ~ 5.5 V |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 16-SSOP（0.209"，5.30mm 宽） |
| 供应商设备封装： | 16-SSOP |
| 包装： | 管件 |
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DRIVER SECTION
Switching Characteristics
(1)
ESD Protection
3-V TO 5.5-V SINGLE-CHANNEL RS-232 LINE DRIVER/RECEIVER
WITH
±15-kV ESD PROTECTION
SLLS673A – AUGUST 2005 – REVISED FEBRUARY 2006
abc
Electrical Characteristics(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP(2)
MAX
UNIT
VOH
High-level output voltage
DOUT at RL = 3 k to GND,
DIN = GND
5
5.4
V
VOL
Low-level output voltage
DOUT at RL = 3 k to GND,
DIN = VCC
–5
–5.4
V
IIH
High-level input current
VI = VCC
±0.01
±1
A
IIL
Low-level input current
VI at GND
±0.01
±1
A
VCC = 3.6 V,
VO = 0 V
±35
±60
IOS
Short-circuit output current(3)
mA
VCC = 5.5 V,
VO = 0 V
±35
±60
ro
Output resistance
VCC, V+, and V– = 0 V,
VO = ±2 V
300
10M
Ioff
Output leakage current
FORCEOFF = GND,
VO = ±12 V,
VCC = 0 to 5.5 V
±25
A
(1)
Test conditions are C1–C4 = 0.1
F at V
CC = 3.3 V ± 0.3 V; C1 = 0.047 F, C2–C4 = 0.33 F at VCC = 5 V ± 0.5 V.
(2)
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.
(3)
Short-circuit durations should be controlled to prevent exceeding the device absolute power dissipation ratings, and not more than one
output should be shorted at a time.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP(2)
MAX
UNIT
CL = 1000 pF,
RL = 3 k,
250
One DIN switching,
See Figure 1
CL = 1000 pF,
RL = 3 k,
One DIN switching,
Maximum data rate
1000
kbit/s
VCC = 4.5 V,
See Figure 1
CL = 250 pF,
RL = 3 k,
One DIN switching,
1000
VCC = 3 V,
See Figure 1
tsk(p)
Pulse skew(3)
CL = 150 pF to 2500 pF,
RL = 3 k to 7 k,
See Figure 2
25
ns
Slew rate,
VCC = 3.3 V,
RL = 3 k to 7 k,
SR(tr)
24
150
V/
s
transition region
CL = 150 pF to 1000 pF,
See Figure 1
(1)
Test conditions are C1–C4 = 0.1
F at V
CC = 3.3 V ± 0.3 V; C1 = 0.047 F, C2–C4 = 0.33 F at VCC = 5 V ± 0.5 V.
(2)
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.
(3)
Pulse skew is defined as |tPLH – tPHL| of each channel of the same device.
TERMINAL
TEST CONDITIONS
TYP
UNIT
NAME
NO.
Human-Body Model
±15
DOUT
13
Contact Discharge (IEC61000-4-2)
±8
kV
Air-Gap Discharge (IEC61000-4-2)
±8
5
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