General Description The DS1110L 10-tap delay line is a 3V version of the DS1110. It has 10 equally spaced taps providing delays from 10ns to 500ns. The DS1110L series delay lines provide a nominal accuracy of ±5% or ±2ns, whIChever is greater, at 3.3V and +25°C. The DS1110L is character- ized to operate from 2.7V to 3.6V. The DS1110L produces both leading- and trailing-edge delays with equal precision. The device is offered in a standard 14-pin TSSOP. Features ? All-Silicon Delay Line ? 3V Version of the DS1110 ? 10 Taps Equally Spaced ? Delays Are Stable and Precise ? Leading- and Trailing-Edge Accuracy ? Delay Tolerance ±5% or ±2ns, Whichever Is Greater, at 3.3V and +25°C ? Economical ? Low-Profile 14-Pin TSSOP ? Low-Power CMOS ? TTL/CMOS Compatible ? Vapor Phase and IR Solderable ? Fast-Turn Prototypes ? Delays Specified Over Commercial and Industrial Temperature Ranges ? Custom Delays Available DS1110L 3V 10-Tap Silicon Delay Line _____________________________________________ Maxim Integrated Products 1 14 13 12 11 10 9 8 1 2 3 4 5 6 7 V CC TAP1 TAP3 TAP5TAP4 TAP2 N.C. IN TOP VIEW TAP7 TAP9 TAP10GND TAP8 TAP6 TSSOP (173mil) DS1110L Pin Configuration Ordering Information XX-XXXX; Rev 1; 11/03 For pricing, delivery, and ordering information, please contact Maxim/Dallas Direct! at 1-888-629-4642, or visit Maxim’s website at www.maxim-ic.com. PART TEM P RANGE PIN- PACKAGE TOTAL DELAY ( ns) * DS1110LE-100 -40°C to +85°C 14 TSSOP (173mil) 100 DS1110LE-125 -40°C to +85°C 14 TSSOP (173mil) 125 DS1110LE-150 -40°C to +85°C 14 TSSOP (173mil) 150 DS1110LE-175 -40°C to +85°C 14 TSSOP (173mil) 175 DS1110LE-200 -40°C to +85°C 14 TSSOP (173mil) 200 DS1110LE-250 -40°C to +85°C 14 TSSOP (173mil) 250 DS1110LE-300 -40°C to +85°C 14 TSSOP (173mil) 300 DS1110LE-350 -40°C to +85°C 14 TSSOP (173mil) 350 DS1110LE-400 -40°C to +85°C 14 TSSOP (173mil) 400 DS1110LE-450 -40°C to +85°C 14 TSSOP (173mil) 450 DS1110LE-500 -40°C to +85°C 14 TSSOP (173mil) 500 *Custom delays are available. Applications Communications Equipment Medical Devices Automated Test Equipment PC Peripheral Devices