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参数资料
| 型号： | SN54F251BJ |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 128Kx8 Nonvolatile SRAM, 10% Voltage Tolerance 32-DIP MODULE 0 to 70 |
| 中文描述： | 1中，8个数据选择器/多路复用器与三态输出 |
| 文件页数： | 1/7页 |
| 文件大小： | 99K |
| 代理商： | SN54F251BJ |
SN54F251B, SN74F251B
1-OF-8 DATA SELECTORS/MULTIPLEXERS
WITH 3-STATE OUTPUTS
SDFS066A – MARCH 1987 – REVISED OCTOBER 1993
Copyright
1993, Texas Instruments Incorporated
2–1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
3-State Versions of SN54F151B and
SN74F151B
3-State Outputs Interface Directly With
System Bus
Performs Parallel-to-Serial Conversion
Complementary Outputs Provide True and
Inverted Data
Package Options Include Plastic
Small-Outline Packages, Ceramic Chip
Carriers, and Standard Plastic and Ceramic
300-mil DIPs
description
These data selectors/multiplexers contain full
binary decoding to select one of eight data
sources
and
feature
complementary outputs. The 3-state outputs can
interface with and drive data lines of bus-
organized systems. When the strobe (G) input is
high, both outputs are in a high-impedance state
in which both the upper and lower transistors of
each totem-pole output are off, and the output
neither drives nor loads the bus significantly.
strobe-controlled
The SN54F251B is characterized for operation
over the full military temperature range of –55
°
C
to 125
°
C. The SN74F251B is characterized for
operation from 0
°
C to 70
°
C.
FUNCTION TABLE
INPUTS
OUTPUTS
SELECT
STROBE
G
C
B
A
Y
W
X
X
X
H
Z
Z
L
L
L
L
D0
D0
L
L
H
L
D1
D1
L
H
L
L
D2
D2
L
H
H
L
D3
D3
H
L
L
L
D4
D4
H
L
H
L
D5
D5
H
H
L
L
D6
D6
H
H
H
L
D7
D7
D0, D1, . . . D7 = the level of the respective D input.
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
D3
D2
D1
D0
Y
W
G
GND
V
CC
D4
D5
D6
D7
A
B
C
SN54F251B . . . J PACKAGE
SN74F251B . . . D OR N PACKAGE
(TOP VIEW)
3
2
1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
D5
D6
NC
D7
A
D1
D0
NC
Y
W
SN54F251B . . . FK PACKAGE
(TOP VIEW)
D
D
N
C
B
D
G
G
N
NC – No internal connection
V
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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