参数资料
型号: 0015291025
厂商: Molex Inc
文件页数: 5/5页
文件大小: 0K
描述: CONN SHUNT CLOSED TOP .100 GOLD
产品目录绘图: 15-29-1025, 15-38-1026
标准包装: 10,000
系列: C-Grid® 90059
类型: 顶部关闭
类型: 母插口
位置或引脚数目(栅极): 2(1 x 2)
间距: 0.100"(2.54mm)
高度: 0.347"(8.81mm)
触点表面涂层:
触点涂层厚度: 15µin(0.38µm)
颜色:
包装: 散装
产品目录页面: 186 (CN2011-ZH PDF)
其它名称: 0015-29-1025
0015-29-1025-C
0015291025-C
15-29-1025
15-29-1025-C
15-29-1025-ND
15291025
15291025-C
WM23943
PRODUCT SPECIFICATION
5.3
Environmental
Item
Thermal Shock
Thermal Aging
Humidity
(Steady State)
Humidity
(Cyclic)
Fretting
Temperature Rise
and
Current Cycling
Test Condition
Mate connectors; expose to 5 cycles of:
Temperature °C    Duration (Minutes)
-40 +0/-3 30
+105 +3/-0 30
Mate connectors exposes to 240
hours at 105 ± 2oC
Mate connectors exposed to 40 ± 2oC,
90-95% RH, for 240 hours per MIL-
STD-202F, Method 103B, Test
Condition A
Test mate connectors per MIL-STD-
202F, Method 106E, excluding steps
7a and 7b
Mate connectors; expose for 500 cycles
of:
Temperature °C    Duration (Minutes)
+25 ± 10 30
+70 +3/-0 30
Mate the connectors and measure the
temperature rise at the rated current
after 96 hours, then after 45 minutes
ON, 15 minutes OFF for 240 hours,
and finally at the rated current after 96
Requirement
Appearance: No damage
Maximum contact resistance
change:
10 milliohms
Appearance: No damage
Maximum contact resistance
change:
10 milliohms
Appearance: No damage
Maximum contact resistance
change:
10 milliohms
Appearance: No damage
Maximum contact
resistance change:
10 milliohms
Appearance: No damage
Maximum contact resistance
change:
10 milliohms
Maximum temperature rise:
30°C over ambient
Maximum contact resistance
change:
10 milliohms
hours.
Reference Test Report Nos.: 2281, 2445, 4146, 4147
REVISION:
E
ECR/ECN INFORMATION:
EC No: UCP2010-1548
DATE: 2010 / 12 / 22
TITLE:
PRODUCT SPEC
TWO-CIRCUIT SHUNT
SHEET No.
5 of 5
DOCUMENT NUMBER:
PS-7859
CREATED / REVISED BY:
J SCHAFER/MIBARRA
CHECKED BY:
DMORGAN
APPROVED BY:
SMILLER
TEMPLATE FILENAME: TEST_SUMMARY[SIZE_A](V.1).DOC
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