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| 型号： | 08056C103MAT2A |
| 厂商： | AVX Corporation |
| 英文描述： | General Specifications |
| 中文描述： | 一般规格 |
| 文件页数： | 6/20页 |
| 文件大小： | 338K |
| 代理商： | 08056C103MAT2A |
54
General Description
Typical Cap. Change vs. D.C. Volts
X7R
Typical Cap. Change vs. Temperature
X7R
Effects of Time – Class 2 ceramic capacitors change
capacitance and dissipation factor with time as well as tem-
perature, voltage and frequency. This change with time is
known as aging. Aging is caused by a gradual re-alignment
of the crystalline structure of the ceramic and produces an
exponential loss in capacitance and decrease in dissipation
factor versus time. A typical curve of aging rate for semi-
stable ceramics is shown in Figure 6.
If a Class 2 ceramic capacitor that has been sitting on the
shelf for a period of time, is heated above its curie point,
(125°C for 4 hours or 150°C for 12 hour will suffice) the part
will de-age and return to its initial capacitance and dissi-
pation factor readings. Because the capacitance changes
rapidly, immediately after de-aging, the basic capacitance
measurements are normally referred to a time period some-
time after the de-aging process. Various manufacturers use
different time bases but the most popular one is one day
or twenty-four hours after “last heat.” Change in the aging
curve can be caused by the application of voltage and
other stresses. The possible changes in capacitance due to
de-aging by heating the unit explain why capacitance
changes are allowed after test, such as temperature cycling,
moisture resistance, etc., in MIL specs. The application of
high voltages such as dielectric withstanding voltages also
tends to de-age capacitors and is why re-reading of capaci-
tance after 12 or 24 hours is allowed in military specifica-
tions after dielectric strength tests have been performed.
Effects of Frequency – Frequency affects capacitance
and impedance characteristics of capacitors. This effect is
much more pronounced in high dielectric constant ceramic
formulation that is low K formulations. AVX’s SpiCap soft-
ware generates impedance, ESR, series inductance, series
resonant frequency and capacitance all as functions of
frequency, temperature and DC bias for standard chip sizes
and styles. It is available free from AVX and can be down-
loaded for free from AVX website: www.avxcorp.com.
25%
50%
75%
100%
Percent Rated Volts
Capacitance
Change
Percent
2.5
0
-2.5
-5
-7.5
-10
0VDC
-55 -35
-15
+5
+25 +45 +65 +85 +105 +125
Temperature Degrees Centigrade
Capacitance
Change
Percent
+20
+10
0
-10
-20
-30
Figure 4
Figure 5
1
10
100
1000 10,000 100,000
Hours
Capacitance
Change
Percent
+1.5
0
-1.5
-3.0
-4.5
-6.0
-7.5
Characteristic
Max. Aging Rate %/Decade
C0G (NP0)
X7R, X5R
Y5V
None
2
7
Figure 6
Typical Curve of Aging Rate
X7R
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| 08056C104JAZ2A | 功能描述:多层陶瓷电容器MLCC - SMD/SMT 0805 0.1uF 6.3volts X7R 5% RoHS:否 制造商:American Technical Ceramics (ATC) 电容:10 pF 容差:1 % 电压额定值:250 V 温度系数/代码:C0G (NP0) 外壳代码 - in:0505 外壳代码 - mm:1414 工作温度范围:- 55 C to + 125 C 产品:Low ESR MLCCs 封装:Reel |
| 08056C105JAZ2A | 功能描述:多层陶瓷电容器MLCC - SMD/SMT 6.3volts 1uF 5% X7R RoHS:否 制造商:American Technical Ceramics (ATC) 电容:10 pF 容差:1 % 电压额定值:250 V 温度系数/代码:C0G (NP0) 外壳代码 - in:0505 外壳代码 - mm:1414 工作温度范围:- 55 C to + 125 C 产品:Low ESR MLCCs 封装:Reel |
| 08056C105K4T2A | 功能描述:多层陶瓷电容器MLCC - SMD/SMT 6.3volts 1uF 10% X7R RoHS:否 制造商:American Technical Ceramics (ATC) 电容:10 pF 容差:1 % 电压额定值:250 V 温度系数/代码:C0G (NP0) 外壳代码 - in:0505 外壳代码 - mm:1414 工作温度范围:- 55 C to + 125 C 产品:Low ESR MLCCs 封装:Reel |
| 08056C105K4T4A | 功能描述:多层陶瓷电容器MLCC - SMD/SMT 6.3volts 1uF 10% X7R 0805 SIZE RoHS:否 制造商:American Technical Ceramics (ATC) 电容:10 pF 容差:1 % 电压额定值:250 V 温度系数/代码:C0G (NP0) 外壳代码 - in:0505 外壳代码 - mm:1414 工作温度范围:- 55 C to + 125 C 产品:Low ESR MLCCs 封装:Reel |
| 08056C105KAZ2A | 功能描述:多层陶瓷电容器MLCC - SMD/SMT 6.3volts 1uF 10% X7R RoHS:否 制造商:American Technical Ceramics (ATC) 电容:10 pF 容差:1 % 电压额定值:250 V 温度系数/代码:C0G (NP0) 外壳代码 - in:0505 外壳代码 - mm:1414 工作温度范围:- 55 C to + 125 C 产品:Low ESR MLCCs 封装:Reel |
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