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参数资料
| 型号： | 1102X40M00000AF |
| 厂商： | VECTRON INTERNATIONAL |
| 元件分类： | XO, clock |
| 英文描述： | CRYSTAL OSCILLATOR, CLOCK, 40 MHz, ACMOS OUTPUT |
| 封装： | PLASTIC, FLAT PACKAGE-14 |
| 文件页数： | 6/22页 |
| 文件大小： | 468K |
| 代理商： | 1102X40M00000AF |
SIZE
CODE IDENT NO.
UNSPECIFIED TOLERANCES
DWG NO.
REV.
SHEET
A
00136
N/A
OS-68338
K
14
Subgroup
Class
Test
Mil-STD-883
Quantity
Mil-PRF-
38534
Reference
K
Method
Condition
(accept number)
Paragraph
1
X
Element Electrical
A. May perform at wafer level
B. All failures shall be removed
from the lot
C. Perform at room ambient
100%
C.3.3.1
2
X
Element Visual
2010
100%
C.3.3.2
3
X
Internal Visual
2010
10(0) or 22(0)
C.3.3.3
C.3.3.4.2
4
X
Temperature Cycling
1010
C
C.3.3.3
X
Mechanical Shock
or
Constant Acceleration
2002
2001
B, Y1
direction
3,000 G, Y1
direction
10(0)
22(0)
X
Interim Electrical
C.3.3.4.3
X
Burn-In
1015
240 hours
minimum at
+125°C
X
Post Burn-In Electrical
C.3.3.4.3
X
Steady State Life
1005
X
Final Electrical
C.3.3.4.3
5
X
Wire Bond Evaluation
2011
10(0) wires or
20(1) wires
C.3.3.3
C.3.3.5
6
X
SEM
2018
See method 2018
C.3.3.6
Notes:
Subgroups 3, 4, & 5 shall be performed on a sample of 10 die if the wafer lot is from a QPL/QML line. If the die are
from commercial wafer lots, then the sample size shall be 22 die.
TABLE 6 - MICROCIRCUIT ENHANCED ELEMENT EVALUATION
Parts Type
Test
Requirement
Paragraph
Sample size
Allowable Reject(s)
Ceramic Capacitors
M55681 FRL S or
M123 (chips)
N/A
Resistors
M55342 FRL R or
S
N/A
Inductors
Group A
Mil-Std-981
Custom
Group B
Mil-Std-981
TABLE 7: PASSIVE COMPONENT ENHANCED ELEMENT EVALUATION
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