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参数资料
| 型号： | 2SK3857TV-A |
| 元件分类： | 小信号晶体管 |
| 英文描述： | 0.37 mA, N-CHANNEL, Si, SMALL SIGNAL, JFET |
| 封装： | LEAD FREE, 2-1H1A, VESM2, 3 PIN |
| 文件页数： | 2/5页 |
| 文件大小： | 148K |
| 代理商： | 2SK3857TV-A |
2SK3857TV
2007-11-01
2
Electrical Characteristics (Ta=25°C)
Characteristic
Symbol
Test Condition
Min
Typ.
Max
Unit
Drain Current
IDSS
VDS = 2 V, VGS = 0
140
350
A
Drain Current
ID
VDD = 2 V, RL= 2.2kΩ,Cg = 5pF
370
A
Gate-Source Cut-off Voltage VGS(OFF) VDS = 2 V, ID = 1μA
-0.1
-1.0
V
Forward transfer admittance
|Yfs|
VDS = 2 V,VGS = 0V
0.9
1.3
mS
Gate-Drain Voltage
V(BR)GDO IG=-10μA
-20
V
Input capacitance
Ciss
VDS = 2 V, VGS = 0, f = 1 MHz
3.5
pF
Voltage Gain
Gv
VDD = 2V, RL= 2.2kΩ,Cg = 5pF, f = 1kHz,vin=100mV
-3.0
-0.5
dB
Delta Voltage Gain
DGv(f)
VDD = 2V, RL= 2.2kΩ,Cg = 5pF,f = 1kHz to 100Hz,vin=100mV
0
-1
dB
Delta Voltage Gain
DGv(V)
VDD = 2V to 1.5V, RL= 2.2kΩ,Cg = 5pF,f = 1kHz, vin=100mV
-0.8
-2
dB
Noise Voltage
VN
VDD = 2V, RL= 1kΩ,Cg = 10pF,Gv=80dB, A-Curve Filter
25
55
mV
Total Harmonic Distortion
THD
VDD = 2V, RL= 2.2kΩ,Cg = 5pF, f = 1kHz, vin=50mV
0.7
%
Time Output Stability
tos
VDD = 2V, RL= 2.2kΩ,Cg = 5pF
100
200
ms
Time Output Stability Test Method
a) TEST CIRCUIT
b) TEST SIGNAL
VDD=2.0V
5pF
2.2k
Ω
Vout
tos
90%
VDD-ID*RL
50%
2V
0V
VDD
0V
Vout
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相关代理商/技术参数 |
参数描述 |
|---|---|
| 2SK3863(Q) | 制造商:Toshiba America Electronic Components 功能描述: |
| 2SK3863(TE16L1,Q) | 制造商:Toshiba America Electronic Components 功能描述:MOSFET N-CH 500V 5A DP |
| 2SK3868(Q) | 制造商:Toshiba America Electronic Components 功能描述:Trans MOSFET N-CH 500V 5A 3-Pin(3+Tab) TO-220SIS 制造商:Toshiba America Electronic Components 功能描述:PowerMOS,Nch,Vdss=500V,Id=5A,TO-220SIS |
| 2SK3868(Q,M) | 功能描述:MOSFET MOSFET N-Ch, 500V, 5A RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS（导通）:0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube |
| 2SK3869 | 制造商:Toshiba America Electronic Components 功能描述:MOSFET N 450V TO-220SIS |
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