参数资料
型号: 4431-T-B1 D 434
厂商: Silicon Laboratories Inc
文件页数: 11/47页
文件大小: 799K
描述: KIT DEV TEST EZRADIOPRO SI4431
标准包装: 1
附件类型: 测试卡,收发器,434MHz
适用于相关产品: EZRadioPRO?
Si4430/31/32-B1
Rev 1.1
11
Table 5. Auxiliary Block Specifications
1
Parameter
Symbol
Conditions
Min
Typ
Max
Units
Temperature Sensor
Accuracy
2
TS
A
After calibrated via sensor offset
register tvoffs[7:0]

0.5

Temperature Sensor
Sensitivity
2
TS
S

5

mV/癈
Low Battery Detector
Resolution
2
LBD
RES

50

mV
Low Battery Detector
Conversion Time
2
LBD
CT

250

Microcontroller Clock
Output Frequency
F
MC
Configurable to 30 MHz,
15 MHz, 10 MHz, 4 MHz,
3 MHz, 2 MHz, 1 MHz, or
32.768 kHz
32.768K

30M
Hz
General Purpose ADC
Resolution
2
ADC
ENB

8

bit
General Purpose ADC Bit
Resolution
2
ADC
RES

4

mV/bit
Temp Sensor & General
Purpose ADC Conversion
Time
2
ADC
CT

305

30 MHz XTAL Start-Up time
t
30M
Using XTAL and board layout in
reference design. Start-up time
will vary with XTAL type and
board layout.

600

30 MHz XTAL Cap
Resolution
2
30M
RES
See "5.8. Crystal Oscillator" on
page 40 for total load
capacitance calculation

97

fF
32 kHz XTAL Start-Up Time
2
t
32k

6

sec
32 kHz Accuracy using
Internal RC Oscillator
2
32KRC
RES

1000

ppm
32 kHz RC Oscillator Start-
Up
t
32kRC

500

POR Reset Time
t
POR

16

ms
Software Reset Time
2
t
soft

250

Notes:
1.  All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are 
listed in the "Production Test Conditions" section on page 14.
2. Guaranteed by qualification. Qualification test conditions are listed in the "Production Test Conditions" section on 
page 14.
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