参数资料
型号: 500972-1107
厂商: Molex Connector Corporation
文件页数: 6/14页
文件大小: 0K
描述: CONN MEMORY MINI SD TOP SMD
产品变化通告: 500972 Series Obsolescence 29/Sept/2010
产品目录绘图: 500972-1107
标准包装: 1
系列: 500972
卡类型: 安全数字式 - miniSD&trade
位置数: 13(10 + 3)
连接器类型: 连接器和弹出器
插入,移除方法: 推入式,推出式
安装类型: 表面贴装,直角
特点: 板导轨,开关
板上方高度: 0.087"(2.20mm)
安装特点: 正常,标准 - 顶部
包装: 标准包装
触点表面涂层:
触点涂层厚度: 4µin(0.10µm)
其它名称: WM23957DKR
LANGUAGE
PRODUCT SPECIFICATION
JAPANESE
ENGLISH
Item
Test Condition
-55 3 ° C 30
+85 2 ° C 30
1
5
3
1 2
(JIS C0025)
Mate dummy card and subject to the following
Requirement
Appearance
No Damage
4-3-7
Temperature
Cycling
conditions for 5 cycles. Upon completion of
the exposure period, the test specimens
shall be conditioned at ambient room conditions
for 1 to 2 hours, after which the specified
measurements shall be performed.
1 cycle
a) -55 3 ° C 30 minutes
b) +85 2 ° C
30 minutes
Transit time shall be within 3 minutes.
(JIS C0025)
85 2
96
1 2
Contact
Resistance
140 milliohms
MAXIMUM
(JIS C 60068-2-2/MIL-STD-202
108)
Appearance
No Damage
4-3-8
Heat Resistance
Mate dummy card and exposed to 85 2 ° C
for 96 hours. Upon completion of the exposure
period, the test specimens shall be conditions
at ambient room conditions for 1 to 2 hours,
after which the specified measurements
shall be performed.
(JIS C 60068-2-2/MIL-STD-202 Method 108)
-40 2
96
1 2
(JIS C 60068-2-1)
Contact
Resistance
Appearance
140 milliohms
MAXIMUM
No Damage
4-3-9
Cold Resistance
Mate dummy card and exposed to -40 2 ° C
for 96 hours. Upon completion of the exposure
period, the test specimens shall be conditions
at ambient room conditions for 1 to 2 hours,
after which the specified measurements
shall be performed.
(JIS C 60068-2-1)
TITLE:
REVISE ON PC ONLY
Contact
Resistance
140 milliohms
MAXIMUM
miniSD SOCKET CONNECTOR
C
REV.
SEE SHEET 1 OF 14
DESCRIPTION
(NORMAL TYPE)
THIS DOCUMENT CONTAINS INFORMATION THAT IS PROPRIETARY TO
MOLEX INC. AND SHOULD NOT BE USED WITHOUT WRITTEN PERMISSION
DOCUMENT NUMBER
PS-500972-001
FILE NAME
SEE SHEET 1 OF 14
SHEET
6 OF 14
EN-37-1(019)
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