参数资料
型号: 5645L
厂商: Pomona Electronics
文件页数: 1/1页
文件大小: 0K
描述: TEST CLIP 160PIN QFP .65MM PITCH
标准包装: 1
系列: EIAJ
类型: QFP,0.65mm 间距
位置或引脚数目(栅极): 160(4 x 40)
触点表面涂层:
Pomona
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Model 5645L & 5645L-2
160 Pin QFP Locking Test Clip
0.65mm Lead Pitch
hese new locking test clips provide the user
with an easy means to connect
instrumentation to the fine pitch QFP chip
leads.
The special locking fingers at each corner
attach to the body of the chip and hold the
clip firmly against the chip leads.
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Centrally activated locking mechanism
allows testing vertical boards..
Interfaces with high density 160 Pin EIAJ
QFP surface mount chip leads.
Two stage alignment assures positive
connections.
Gold plated connector pins and contacts
assure noise free connections.
Gold plated .025" square pins provide
easy connection with either ribbon cable or discrete jumpers.
Pomona's EIAJ test clips are perfect for system design, field service testing, failure analysis, and for use with logic
analyzers. Other clips are also available in other sizes to fit the most popular EIAJ chips now in use. Pomona offers a
test clip to fit the most commonly found variations on the EIAJ specifications.
Leads
“D”
31.9mm
Body
“D1”
28.0mm
Lead Interface
“C”
30.3mm
ChipHeight
“A”
3.4mm
Pomona
Part Number
5645L
(1.193")
31.2mm
28.0mm
29.6mm
3.4mm
5645L-2
(1.165")
All dimensions are in inches. Tolerances (except noted): .xx = ±.02” (,51 mm), .xxx = ± .005” (,127 mm).
All specifications are to the latest revisions. Specifications are subject to change without notice.
Registered trademarks are the property of their respective companies. Made in USA
Sales: 800-490-2361 Fax: 888-403-3360
6/9/99
Technical Assistance: 800-241-2060
Pomona ACCESS 90352 (800) 444-6785 or (425) 446-6010
SY/EH/LS
C:\Laura Goldberg\FlukeDataSheet\d5645L_45L-2_1_01.doc
More drawings available at www.pomonaelectronics.com
Page 1 of 1
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