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| 型号： | 5962-8992101XA |
| 厂商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分类： | 基准电压源/电流源 |
| 英文描述： | 1-OUTPUT TWO TERM VOLTAGE REFERENCE, 6.9 V, MBCY2 |
| 封装： | METAL CAN, TO-46, 2 PIN |
| 文件页数： | 1/4页 |
| 文件大小： | 14K |
| 代理商： | 5962-8992101XA |
Original Creation Date: 07/10/95
Last Update Date: 02/24/03
Last Major Revision Date: 07/10/95
MNLM129A-X REV 0CL
MICROCIRCUIT DATA SHEET
PRECISION REFERENCE
General Description
The LM129 is a precision multi-current temperature-compensated 6.9V zener reference with
dynamic impedances a factor of 10 to 100 less than discrete diodes. Constructed in a
single silicon chip, the LM129 uses active circuitry to buffer the internal zener allowing
the device to operate over a 0.5 mA to 15 mA range with virtually no change in
performance. The LM129 is available with selected temperature coefficients of 0.001,
0.002, 0.005 and 0.01%/ C. These new references also have excellent long term stability
and low noise.
A new subsurface breakdown zener used in the LM129 gives lower noise and better long-term
stability than coventional IC zeners. Further the zener and temperature compensating
transistor are made by a planar process so they are immune to problems that plague
ordinary zeners. For example, there is virtually no voltage shift in zener voltage due to
temperature cycling and the device is insenstive to stress on the leads.
The LM129 can be used in place of conventional zeners with improved performance. The low
dynamic impedance simplifies biasing and the wide operating current allows the replacement
of may zener types.
The LM129 is packaged in a 2-lead T0-46 package and is rated for operation over a -55 C to
+125 C temperature range.
NS Part Numbers
LM129AH-SMD*
LM129AH/883
Industry Part Number
LM129
Prime Die
LM129
Controlling Document
5962-8992101XA*
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
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