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参数资料
| 型号： | 5962-9169003MXA |
| 厂商： | ANALOG DEVICES INC |
| 元件分类： | ADC |
| 英文描述： | 1-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, CDIP28 |
| 封装： | CERAMIC, DIP-28 |
| 文件页数： | 12/18页 |
| 文件大小： | 355K |
| 代理商： | 5962-9169003MXA |
REV. C
–3–
CONVERTER START TIMING (Figure 1)
J, K, A, B Grades
T Grade
Parameter
Symbol
Min Typ Max
Min Typ Max Unit
Conversion Time
8-Bit Cycle (AD674B)
tC
68
10
68
10
s
12-Bit Cycle (AD674B) tC
912
15
912
15
s
8-Bit Cycle (AD774B)
tC
45
6
45
6
s
12-Bit Cycle (AD774B) tC
6
7.3
8
6
7.3
8
s
STS Delay from CE
tDSC
200
225
ns
CE Pulsewidth
tHEC
50
ns
CS to CE Setup
tSSC
50
ns
CS Low During CE High
tHSC
50
ns
R/
C to CE Setup
tSRC
50
ns
R/
C LOW During CE High tHRC
50
ns
A0 to CE Setup
tSAC
00
ns
A0 Valid During CE High
tHAC
50
ns
READ TIMING—FULL CONTROL MODE (Figure 2)
J, K, A, B Grades
T Grade
Parameter
Symbol
Min Typ
Max Min Typ Max Unit
Access Time
CL = 100 pF
tDD
1
75
150
75
150
ns
Data Valid After CE Low
tHD
25
2
25
2
ns
20
3
15
4
ns
Output Float Delay
tHL
5
150
ns
CS to CE Setup
tSSR
50
ns
R/
C to CE Setup
tSRR
00
ns
A0 to CE Setup
tSAR
50
ns
CS Valid After CE Low
tHSR
00
ns
R/
C High After CE Low
tHRR
00
ns
A0 Valid After CE Low
tHAR
50
ns
NOTES
1t
DD is measured with the load circuit of Figure 3a and is defined as the time required
for an output to cross 0.4 V or 2.4 V.
20
°C to T
MAX.
3At –40
°C.
4At –55
°C.
5t
HL is defined as the time required for the data lines to change 0.5 V when loaded with
the circuit of Figure 3b.
Specifications shown in boldface are tested on all devices at final electrical test with
worst case supply voltages at TMIN, 25
°C, and T
MAX. Results from those tests are used
to calculate outgoing quality levels. All min and max specifications are guaranteed,
although only those shown in boldface are tested.
Specifications subject to change without notice.
Parameter
Test Conditions
Min
Max
Unit
LOGIC INPUTS
VIH
High Level Input Voltage
2.0
VLOGIC + 0.5
V
VIL
Low Level Input Voltage
–0.5
+0.8
V
IIH
High Level Input Current
VIN = VLOGIC
–10
+10
A
IIL
Low Level Input Current
VIN = 0 V
–10
+10
A
CIN
Input Capacitance
10
pF
LOGIC OUTPUTS
VOH
High Level Output Voltage
IOH = 0.5 mA
2.4
V
VOL
Low Level Output Voltage
IOL = 1.6 mA
0.4
V
IOZ
High-Z Leakage Current
VIN = 0 to VLOGIC
–10
+10
A
COZ
High-Z Output Capacitance
10
pF
DIGITAL SPECIFICATIONS
(For all grades TMIN to TMAX with VCC = +15 V
10% or +12 V
5%, VLOGIC = +5 V
10%,
VEE = –15 V
10% or –12 V
5%, unless otherwise noted.)
SWITCHING SPECIFICATIONS
(For all grades TMIN to TMAX with VCC = +15 V
10% or +12 V
5%,
VLOGIC = +5 V
10%, VEE = –15 V
10% or –12 V
5%, unless otherwise noted.)
tHEC
tHSC
tSSC
tHRC
tSRC
tSAC
tHAC
tC
tDSC
CE
CS
R/
C
A0
STS
DB11 – DB0
HIGH
IMPEDANCE
Figure 1. Convert Start Timing
tSSR
CE
CS
R/
C
A0
STS
DB11 – DB0
tHSR
tHRR
tHAR
tHD
tSAR
tSRR
HIGH
IMPEDANCE
DATA
VALID
HIGH
IMPEDANCE
tHL
tDD
Figure 2. Read Cycle Timing
DBN
3k
100pF
DBN
3k
100pF
5V
HIGH-Z TO LOGIC 0
HIGH-Z TO LOGIC 1
High-Z to Logic 1
High-Z to Logic 0
Figure 3a. Load Circuit for Access Time Test
DBN
3k
100pF
LOGIC 1 TO HIGH-Z
DBN
3k
100pF
5V
LOGIC 0 TO HIGH-Z
Logic 1 to High-Z
Logic 0 to High-Z
Figure 3b. Load Circuit for Output Float Delay Test
AD674B/AD774B
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