参数资料
型号: 5962-9456601MPA
厂商: NATIONAL SEMICONDUCTOR CORP
元件分类: 音频/视频放大
英文描述: 1 CHANNEL, VIDEO AMPLIFIER, CDIP8
封装: CERAMIC, DIP-8
文件页数: 1/12页
文件大小: 90K
代理商: 5962-9456601MPA
Original Creation Date: 02/11/99
Last Update Date: 11/04/99
Last Major Revision Date: 05/06/99
MNCLC411A-X REV 0A0
MICROCIRCUIT DATA SHEET
High-Speed Video Op Amp with Disable
General Description
The Comlinear CLC411 combines a state-of-the-art complementary bipolar process with
Comlinear's patented current-feedback architecture to provide a very high-speed op amp
operating from +15V supplies.
Drawing only 11mA quiescent current, the CLC411 provides a
200MHz small signal bandwidth and a 2300V/us slew rate while delivering a continuos 70mA
current output with +4.5V output swing.
The CLC411's high-speed performance includes a
15ns settling time to 0.1%(2V step) and a 2.3ns rise and fall time (6V step).
The CLC411 is designed to meet the requirements of professional broadcast video systems
including composite video and high definition television.
The CLC411 exceeds the HDTV
standard for gain flatness to 30MHz with it's +0.05dB flat frequency response and exceeds
composite video standards with its very low differential gain and phase errors of 0.02%,
0.03Degrees.
The CLC411 is the op amp of choice for all video systems requiring upward
compatibility from NTSC and PAL to HDTV.
The CLC411 features a very fast disable/enable (10ns/55ns) allowing the multiplexing of
high-speed signals onto an analog bus through the common output connections of multiple
CLC411's.
Using the same signal source to drive disable/enable pins is easy since
"break-before-make" is guaranteed.
NS Part Numbers
CLC411AJ-QML
Industry Part Number
CLC411A
Prime Die
UB1590C
Controlling Document
5962-9456601MPA
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
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