参数资料
型号: 5962-9459001VYA
厂商: NATIONAL SEMICONDUCTOR CORP
元件分类: 门电路
英文描述: 100K SERIES, 5 2-INPUT XOR/XNOR GATE, CQFP24
封装: CERQUAD-24
文件页数: 5/11页
文件大小: 166K
代理商: 5962-9459001VYA
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired. (Note 1)
Storage Temperature (T
STG)
65C to +150C
Maximum Junction Temperature (T
J)
Ceramic
+175C
Plastic
+150C
V
EE Pin Potential to Ground Pin
7.0V to +0.5V
Input Voltage (DC)
V
EE to +0.5V
Output Current (DC Output HIGH)
50 mA
ESD (Note 2)
≥2000V
Recommended Operating
Conditions
Case Temperature (T
C)
Military
55C to +125C
Supply Voltage (V
EE)
5.7V to 4.2V
Note 1: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE = 4.2V to 5.7V, VCC = VCCA = GND, TC = 55C to +125C
Symbol
Parameter
Min
Max
Units
T
C
Conditions
Notes
V
OH
Output HIGH Voltage
1025
870
mV
0C to
+125C
1085
870
mV
55C
V
IN = VIH (Max)
Loading with
1, 2, 3
V
OL
Output LOW Voltage
1830
1620
mV
0C to
or V
IL (Min)
50
to 2.0V
+125C
1830
1555
mV
55C
V
OHC
Output HIGH Voltage
1035
mV
0C to
+125C
1085
mV
55C
V
IN = VIH (Min)
Loading with
1, 2, 3
V
OLC
Output LOW Voltage
1610
mV
0C to
or V
IL (Max)
50
0 to 2.0V
+125C
1555
mV
55C
V
IH
Input HIGH Voltage
1165
870
mV
55C
Guaranteed HIGH Signal
1, 2, 3, 4
+125C
for All Inputs
V
IL
Input LOW Voltage
1830
1475
mV
55C to
Guaranteed LOW Signal
1, 2, 3,4
+125C
for All Inputs
I
IL
Input LOW Current
0.50
A
55C to
V
EE = 4.2V
1, 2, 3
+125C
V
IN = VIL (Min)
I
IH
Input High Current
D
2a–D2e
250
A
0C to
D
1a–D1e
350
+125C
V
EE = 5.7V
1, 2, 3
D
2a–D2e
350
A
55C
V
IN = VIH (Max)
D
1a–D1e
500
I
EE
Power Supply Current
75
25
mA
55C to
Inputs Open
1, 2, 3
+125C
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at 55C, +25C, and +125C, Subgroups 1, 2 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at 55C, +25C, and +125C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing VOH/VOL.
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