参数资料
型号: 5962R9679802VHA
厂商: NATIONAL SEMICONDUCTOR CORP
元件分类: 比较器
英文描述: DUAL COMPARATOR, 6800 uV OFFSET-MAX, 80 ns RESPONSE TIME, CDFP10
封装: CERAMIC, FP-10
文件页数: 3/20页
文件大小: 786K
代理商: 5962R9679802VHA
SMD 5962-9679802, ELDRS FREE
DC DELTA Parameters
The following conditions apply, unless otherwise specified.
V
CM = 0V, Delta calculations performed on QMLV devices at group B, subgroup 5 only.
Symbol
Parameter
Conditions
Notes
Min
Max
Units
Sub-
groups
+I
CC
Positive Supply Current
±V
CC = ±15V, VO = Low
V+ = 5.6V thru 1.4K
-1.0
1.0
mA
1
-I
CC
Negative Supply Current
±V
CC = ±15V, VO = Low
V+ = 5.6V thru 1.4K
-0.5
0.5
mA
1
V
IO
Input Offset Voltage
+
V
CC = 5V, VCM = 1V, RS 5K
-0.4
0.4
mV
1
SMD 5962-9679802, ELDRS FREE
100K Post Radiation Parameters @ 25°C
(Note 14)
The following conditions apply, unless otherwise specified.
V
CM = 0V
Symbol
Parameter
Conditions
Notes
Min
Max
Units
Sub-
groups
I
IB
Input Bias Current
±V
CC = ±15V
1.0
A
1
V
CC = 5V
1.0
A
1
V
IO
Input Offset Voltage
+
V
CC = 5V, VCM = 1V, RS 5K
-4.0
4.0
mV
1
+
V
CC = 5V, VCM = 3V, RS 5K
-4.0
4.0
mV
1
±V
CC = ±15V, VCM = 12V, RS
5K
-4.0
4.0
mV
1
±V
CC = ±15V, VCM = 12V, RS
5K
-4.0
4.0
mV
1
Note 2:
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 3:
The maximum power dissipation must be derated at elevated temperatures and is dictated by T
Jmax (maximum junction temperature), θJA (package
junction to ambient thermal resistance), and T
A (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/
θ
JA or the number given in the Absolute Maximum Ratings, whichever is lower.
Note 4:
For supply voltages less than ±15V the absolute maximum input voltage is equal to the supply voltage.
Note 5:
Human Body model, 1.5K
in series with 100pF.
Note 6:
V
I 8mV at extremes for ILeak and VI 8mV at extremes for VSat (VI to exceed VOS.
Note 7:
5V differential across +V
CC and VCC.
Note 8:
Parameter guaranteed by V
IO and IIO tests.
Note 9:
K = V/mV.
Note 10:
Gain is computed with an output swing from +13.5V to +1.5V.
Note 11:
Gain is computed with an output swing from +5.0V to +0.5V.
Note 12:
Output is monitored by measuring V
I with limits from 0 to 6mV at all temperatures
Note 13:
Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post Radiation Limits Table.
These parts may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate sensitivity. Radiation end point limits for the noted
parameters are guaranteed only for the conditions as specified in MIL-STD-883, per Test Method 1019, Condition A.
Note 14:
Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post Radiation Limits Table.
Low dose rate testing has been performed on a wafer-by-wafer basis, per Test Method 1019, Condition D of MIL-STD-883, with no enhanced low dose rate
sensitivity (ELDRS).
11
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LM119QML
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