参数资料
型号: 5962R9863901V2A
厂商: ANALOG DEVICES INC
元件分类: 运算放大器
英文描述: OP-AMP, 400 uV OFFSET-MAX, CQCC20
封装: CERAMIC, LCC-20
文件页数: 2/13页
文件大小: 72K
代理商: 5962R9863901V2A
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-98639
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
A
SHEET
10
DSCC FORM 2234
APR 97
TABLE IIA. Electrical test requirements.
Test requirements
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class M
Device
class Q
Device
class V
Interim electrical
parameters (see 4.2)
1
Final electrical
parameters (see 4.2)
1,2,3,4 1/
1,2,3,4 1/ 2/
Group A test
requirements (see 4.4)
1,2,3,4,5,6
Group C end-point electrical
parameters (see 4.4)
1
1 2/
Group D end-point electrical
parameters (see 4.4)
1
Group E end-point electrical
parameters (see 4.4)
---
1,4
1/ PDA applies to subgroup 1.
2/ See table IIB for delta measurement parameters.
TABLE IIB. 240 hour burn-in and group C end-point electrical parameters. (TA = +25
°C)
Parameter
Device type
Limits
Delta
Units
Min
Max
Min
Max
VIO
01
-135
+135
-75
+75
V
+IIB
01
-5
+5
-1
+1
nA
-IIB
01
-5
+5
-1
+1
nA
4.2.2 Additional criteria for device classes Q and V.
a.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device
manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document
revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test
method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table IIA herein.
c.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for
groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
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