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| 型号： | 74LVTH182512DGGRE4 |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 总线收发器 |
| 英文描述： | LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64 |
| 封装： | GREEN, PLASTIC, TSSOP-64 |
| 文件页数： | 2/38页 |
| 文件大小： | 735K |
| 代理商： | 74LVTH182512DGGRE4 |
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SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997
10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control register
The boundary-control register (BCR) is three bits long. The BCR is used in the context of the boundary-run test
(RUNT) instruction to implement additional test operations not included in the basic SCOPE
instruction set.
Such operations include PRPG, PSA, and binary count up (COUNT). Table 4 shows the test operations that
are decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 010, which selects the PSA test operation. The BCR order of scan is shown in Figure 3.
Bit 0
(LSB)
TDO
TDI
Bit 1
Bit 2
(MSB)
Figure 3. Boundary-Control Register Order of Scan
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
reducing the number of bits per test pattern that must be applied to complete a test operation. During
Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in Figure 4.
Bit 0
TDO
TDI
Figure 4. Bypass Register Order of Scan
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相关代理商/技术参数 |
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|---|---|
| 74LVTH182512DGGRG4 | 功能描述:特定功能逻辑 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| 74LVTH182646APMG4 | 功能描述:特定功能逻辑 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| 74LVTH182652APMG4 | 功能描述:特定功能逻辑 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| 74LVTH18502APMRG4 | 功能描述:特定功能逻辑 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| 74LVTH18504APMRG4 | 功能描述:特定功能逻辑 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
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