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参数资料
| 型号： | 79C2040RPFK-15 |
| 厂商： | MAXWELL TECHNOLOGIES |
| 元件分类： | PROM |
| 英文描述： | 20 Megabit (512K x 40-Bit) EEPROM MCM |
| 中文描述： | 512K X 40 EEPROM 5V, 150 ns, PDFP100 |
| 封装： | FP-100 |
| 文件页数： | 5/17页 |
| 文件大小： | 469K |
| 代理商： | 79C2040RPFK-15 |
M
5
04.20.05 Rev 1
All data sheets are subject to change without notice
2005 Maxwell Technologies
All rights reserved
20 Megabit (512 x 40-Bit) EEPROMMCM
79C2040
T
ABLE
6. 79C2040 AC E
LECTRICAL
C
HARACTERISTICS
FOR
R
EAD
O
PERATION
1
(V
CC
= 5V ±10%, T
A
= -55
TO
+125°C)
P
ARAMETER
S
YMBOL
S
UBGROUPS
M
IN
M
AX
U
NIT
Address Access Time CE = OE = V
IL
, WE = V
IH
-150
-200
t
ACC
9, 10, 11
--
--
150
200
ns
Chip Enable Access Time OE = V
IL
, WE = V
IH
-150
-200
t
CE
9, 10, 11
--
--
150
200
ns
Output Enable Access TIme CE = V
IL
, WE = V
IH
-150
-200
t
OE
9, 10, 11
0
0
75
100
ns
Output Hold to Address Change CE = OE =V
IL
, WE = V
IH
-150
-200
t
OH
9, 10, 11
0
0
--
--
ns
Output Disable to High-Z
2
CE = V
IL
, WE = V
IH
-150
-200
CE = OE = V
IL
, WE = V
IH
-150
-200
t
DF
t
DFR
9, 10, 11
0
0
0
0
50
60
350
450
ns
ns
RES to Output Delay CE = OE = V
IL
, WE = V
IH3
-150
-200
T
RR
9, 10, 11
0
0
450
650
ns
1. Test conditions: input pulse levels = 0.4V to 2.4V; input rise and fall times < 20 ns; output load = 1 TTL gate + 100 pF (including
scope and fixture); reference levels for measuring timng = 0.8 V/1.8 V.
2. t
DF
and t
DFR
are defined as the time at which the output becomes an open circuit and data is no longer driven.
3. Guaranteed by design.
T
ABLE
7. 79C2040 AC E
LECTRICAL
C
HARACTERISTICS
FOR
W
RITE
O
PERATION
(V
CC
= 5V ±10%, T
A
= -55
TO
+125°C)
P
ARAMETER
S
YMBOL
S
UBGROUPS
M
IN
1
M
AX
U
NITS
Address Setup Time
-150
-200
t
AS
9, 10, 11
0
0
--
--
ns
Chip Enable to Write Setup Time (WE controlled)
-150
-200
t
CS
9, 10, 11
0
0
--
--
ns
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