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参数资料
| 型号： | 935005340602 |
| 厂商： | NXP SEMICONDUCTORS |
| 元件分类： | 编、解码器及复用、解复用 |
| 英文描述： | F/FAST SERIES, 5 3 LINE TO 1 LINE MULTIPLEXER, TRUE OUTPUT, PDIP24 |
| 封装： | 0.300 INCH, SLIM, PLASTIC, MS-001AF, SOT-222-1, DIP-24 |
| 文件页数： | 14/16页 |
| 文件大小： | 132K |
| 代理商： | 935005340602 |
Philips Semiconductors
Product specification
74F711A/74F711–1/
74F712A/74F712–1
Multiplexers
1990 Dec 13
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
IO = 3mA
±10%VCC
2.4
V
VO
High level output voltage
VCC = MIN,
V
MAX
IOH = –3mA
±5%VCC
2.7
3.4
V
VOH
High-level output voltage
VIL = MAX,
VIH = MIN
IO = 15mA
±10%VCC
2.0
V
IH
IOH = –15mA
±5%VCC
2.0
V
74F711A/
74F712A
IO = MAX
±10%VCC
0.38
0.55
V
VOL
Low-level output voltage
74F712A
only
VCC = MIN,
VIL = MAX,
IOL = MAX
±5%VCC
0.42
0.55
V
OL
g
74F711-1/
74F712-1
IL
,
VIH = MIN
IOL = 5mA
±10%VCC
0.38
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input
voltage
VCC = MAX, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
I
Low level input current
Others
VCC = MAX V =0 5V
–20
A
IIL
Low-level input current
Dn only
VCC = MAX, VI = 0.5V
–40
A
IOZH
Off-state output current
High-level voltage
applied
74F711A/
74F711 1
VCC = MAX, VO = 2.7V
50
A
IOZL
Off-state output current
Low-level voltage
applied
74F711-1
only
VCC = MAX, VO = 0.5V
–50
A
IOS
Short-circuit output
current3
74F711-1/
74F712-1
VCC = MAX
–60
–150
mA
IO
Output current4
74F711A/
74F712A
VCC = MAX, VO = 2.25 V
–60
–150
mA
ICCH
25
35
mA
74F711A
ICCL
VCC = MAX
33
46
mA
ICCZ
27
40
mA
ICCH
26
40
mA
ICC
Supply
current
74F711-1
ICCL
VCC = MAX
33
45
mA
ICC
current
(total)
ICCZ
28
45
mA
()
74F712A
ICCH
VCC = MAX
20
27
mA
74F712A
ICCL
VCC = MAX
30
40
mA
74F712 1
ICCH
VCC = MAX
20
30
mA
74F712-1
ICCL
VCC = MAX
29
40
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. IO is tested under conditions that produce current approximity one half of the true short-circuit output current (IOS).
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