93C46B
DS21172E-page 2
2001 Microchip Technology Inc.
1.0
ELECTRICAL
CHARACTERISTICS
1.1
Maximum Ratings*
VCC...................................................................................7.0V
All inputs and outputs w.r.t. VSS .............. -0.6V to VCC +1.0V
Storage temperature .....................................-65°C to +150°C
Ambient temp. with power applied ................-65°C to +125°C
Soldering temperature of leads (10 seconds) ............. +300°C
ESD protection on all pins................................................4 kV
*Notice: Stresses above those listed under “Maximum ratings” may
cause permanent damage to the device. This is a stress rating only and
functional operation of the device at those or any other conditions
above those indicated in the operational listings of this specification is
not implied. Exposure to maximum rating conditions for extended peri-
ods may affect device reliability.
TABLE 1-1
PIN FUNCTION TABLE
Name
Function
CS
Chip Select
CLK
Serial Data Clock
DI
Serial Data Input
DO
Serial Data Output
VSS
Ground
NC
No Connect
VCC
Power Supply
TABLE 1-2
DC AND AC ELECTRICAL CHARACTERISTICS
All parameters apply over
the specified operating
ranges unless otherwise
noted
Commercial (C) VCC = +4.5V to +5.5V TAMB = 0°C to +70°C
Industrial (I)
VCC = +4.5V to +5.5V TAMB = -40°C to +85°C
Automotive (E)
VCC = +4.5V to +5.5V TAMB = -40°C to +125°C
Parameter
Symbol
Min.
Max.
Units
Conditions
High level input voltage
VIH
2.0
VCC +1
V
Low level input voltage
VIL
-0.3
0.8
V
—
Low level output voltage
VOL
—
0.4
V
IOL = 2.1 mA; VCC = 4.5V
High level output voltage
VOH
2.4
—
VIOH = -400 A; VCC = 4.5V
Input leakage current
ILI
-10
10
A
VIN = VSS to VCC
Output leakage current
ILO
-10
10
A
VOUT = VSS to VCC
Pin capacitance
(all inputs/outputs)
CIN, COUT
—
7pF
TAMB = +25°C, FCLK = 1 MHz
Operating current
ICC read
—
1
mA
—
ICC write
—
1.5
mA
—
Standby current
ICCS
—
1A
CS = VSS; DI = VSS
Clock frequency
FCLK
—
2MHz
VCC = 4.5V
Clock high time
TCKH
250
—
ns
—
Clock low time
TCKL
250
—
ns
—
Chip select setup time
TCSS
50
—
ns
Relative to CLK
Chip select hold time
TCSH
0
—
ns
Relative to CLK
Chip select low time
TCSL
250
—
ns
—
Data input setup time
TDIS
100
—
ns
Relative to CLK
Data input hold time
TDIH
100
—
ns
Relative to CLK
Data output delay time
TPD
—
400
ns
CL = 100 pF
Data output disable time
TCZ
—
100
ns
CL = 100 pF (Note 2)
Status valid time
TSV
—
500
ns
CL = 100 pF
Program cycle time
TWC
—
2ms
ERASE/WRITE mode
TEC
—
6
ms
ERAL mode
TWL
—
15
ms
WRAL mode
Endurance
—
1M
—
cycles
25°C, VCC = 5.0V, Block Mode (Note 3)
Note 1: This parameter is tested at TAMB = 25°C and FCLK = 1 MHz.
2: This parameter is periodically sampled and not 100% tested.
3: This application is not tested but ensured by characterization. For endurance estimates in a specific applica-
tion, please consult the Total Endurance Model which may be obtained on our website:
www.microchip.com