参数资料
型号: A3PE600-PQ208I
厂商: Microsemi SoC
文件页数: 94/162页
文件大小: 0K
描述: IC FPGA 600000 GATES 208-PQFP
标准包装: 24
系列: ProASIC3E
RAM 位总计: 110592
输入/输出数: 147
门数: 600000
电源电压: 1.425 V ~ 1.575 V
安装类型: 表面贴装
工作温度: -40°C ~ 85°C
封装/外壳: 208-BFQFP
供应商设备封装: 208-PQFP(28x28)
ProASIC3E Flash Family FPGAs
Revision 13
2-23
Table 2-23 Schmitt Trigger Input Hysteresis
Hysteresis Voltage Value (typ.) for Schmitt Mode Input Buffers
Input Buffer Configuration
Hysteresis Value (typ.)
3.3 V LVTTL/LVCMOS/PCI/PCI-X (Schmitt trigger mode)
240 mV
2.5 V LVCMOS (Schmitt trigger mode)
140 mV
1.8 V LVCMOS (Schmitt trigger mode)
80 mV
1.5 V LVCMOS (Schmitt trigger mode)
60 mV
Table 2-24 I/O Input Rise Time, Fall Time, and Related I/O Reliability*
Input Buffer
Input Rise/Fall Time
(min.)
Input Rise/Fall Time (max.)
Reliability
LVTTL/LVCMOS
(Schmitt trigger disabled)
No requirement
10 ns *
20 years
(110°C)
LVTTL/LVCMOS
(Schmitt trigger enabled)
No requirement
No requirement, but input noise
voltage
cannot
exceed
Schmitt
hysteresis.
20 years
(110°C)
HSTL/SSTL/GTL
No requirement
10 ns *
10 years
(100°C)
LVDS/B-LVDS/M-LVDS/
LVPECL
No requirement
10 ns *
10 years
(100°C)
Note: *For clock signals and similar edge-generating signals, refer to the "ProASIC3/E SSO and Pin
Placement Guidelines" chapter of the ProASIC3E FPGA Fabric User’s Guide. The maximum input
rise/fall time is related to the noise induced into the input buffer trace. If the noise is low, then the
rise time and fall time of input buffers can be increased beyond the maximum value. The longer the
rise/fall times, the more susceptible the input signal is to the board noise. Microsemi recommends
signal integrity evaluation/characterization of the system to ensure that there is no excessive noise
coupling into input signals.
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A3PE600-PQG208 功能描述:IC FPGA 600000 GATES 208-PQFP RoHS:是 类别:集成电路 (IC) >> 嵌入式 - FPGA(现场可编程门阵列) 系列:ProASIC3E 标准包装:90 系列:ProASIC3 LAB/CLB数:- 逻辑元件/单元数:- RAM 位总计:36864 输入/输出数:157 门数:250000 电源电压:1.425 V ~ 1.575 V 安装类型:表面贴装 工作温度:-40°C ~ 125°C 封装/外壳:256-LBGA 供应商设备封装:256-FPBGA(17x17)