参数资料
型号: AD5346BCPZ
厂商: Analog Devices Inc
文件页数: 3/24页
文件大小: 0K
描述: IC DAC 8BIT OCTAL VOUT 40LFCSP
产品培训模块: Data Converter Fundamentals
DAC Architectures
标准包装: 1
设置时间: 6µs
位数: 8
数据接口: 并联
转换器数目: 8
电压电源: 单电源
功率耗散(最大): 8.3mW
工作温度: -40°C ~ 105°C
安装类型: 表面贴装
封装/外壳: 40-VFQFN 裸露焊盘,CSP
供应商设备封装: 40-LFCSP
包装: 托盘
输出数目和类型: 8 电压,单极;8 电压,双极
采样率(每秒): 167k
AD5346/AD5347/AD5348
Rev. 0 | Page 11 of 24
Offset Error Drift
This is a measure of the change in offset error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
DC Power-Supply Rejection Ratio (PSRR)
This indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in VOUT to
a change in VDD for full-scale output of the DAC. It is measured
in dB. VREF is held at 2 V and VDD is varied ±10%.
DC Crosstalk
This is the dc change in the output level of one DAC at midscale
in response to a full-scale code change (all 0s to all 1s and vice
versa) and output change of another DAC. It is expressed in V.
Reference Feedthrough
This is the ratio of the amplitude of the signal at the DAC
output to the reference input when the DAC output is not being
updated, i.e., LDAC is high. It is expressed in dB.
Channel-to-Channel Isolation
This is a ratio of the amplitude of the signal at the output of one
DAC to a sine wave on the reference inputs of the other DACs.
It is measured by grounding one VREF pin and applying a 10 kHz,
4 V p-p sine wave to the other VREF pins. It is expressed in dB.
Major-Code Transition Glitch Energy
This is the energy of the impulse injected into the analog output
when the DAC changes state. It is normally specified as the area
of the glitch in nV-s and is measured when the digital code is
changed by 1 LSB at the major carry transition (011 . . . 11 to
100 . . . 00 or 100 . . . 00 to 011 . . . 11).
Digital Feedthrough
This is a measure of the impulse injected into the analog output
of the DAC from the digital input pins of the device, but it is
measured when the DAC is not being written to, CS held high.
It is specified in nV-s and is measured with a full-scale change
on the digital input pins, i.e., from all 0s to all 1s and vice versa.
Digital Crosstalk
This is the glitch impulse transferred to the output of one DAC
at midscale in response to a full-scale code change (all 0s to all
1s and vice versa) in the input register of another DAC. It is
expressed in nV-s.
Analog Crosstalk
This is the glitch impulse transferred to the output of one DAC
due to a change in the output of another DAC. It is measured by
loading one of the input registers with a full-scale code change
(all 0s to all 1s and vice versa) while keeping LDAC high. Then
pulse LDAC low and monitor the output of the DAC whose
digital code was not changed. The area of the glitch is expressed
in nV-s.
DAC-to-DAC Crosstalk
This is the glitch impulse transferred to the output of one DAC
due to a digital code change and subsequent output change of
another DAC. This includes both digital and analog crosstalk. It
is measured by loading one of the DACs with a full-scale code
change (all 0s to all 1s and vice versa) with the LDAC pin set
low and monitoring the output of another DAC. The energy of
the glitch is expressed in nV-s.
Multiplying Bandwidth
The amplifiers within the DAC have a finite bandwidth. The
multiplying bandwidth is a measure of this. A sine wave on the
reference (with full-scale code loaded to the DAC) appears on
the output. The multiplying bandwidth is the frequency at
which the output amplitude falls to 3 dB below the input.
Total Harmonic Distortion (THD)
This is the difference between an ideal sine wave and its
attenuated version using the DAC. The sine wave is used as the
reference for the DAC, and the THD is a measure of the
harmonics present on the DAC output. It is measured in dB.
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AD5346BRUZ 制造商:Analog Devices 功能描述:IC 8BIT DAC SERIAL I/F OCTAL 5346