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参数资料
| 型号： | AD53509JSQ |
| 厂商： | ANALOG DEVICES INC |
| 元件分类： | 通用总线功能 |
| 英文描述： | High-Performance Driver/Comparator Active Load on a Single Chip |
| 中文描述： | LINE DRIVER, PQFP52 |
| 封装： | HEAT SINK, LQFP-52 |
| 文件页数： | 1/8页 |
| 文件大小： | 110K |
| 代理商： | AD53509JSQ |
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
a
AD53509
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
World Wide Web Site: http://www.analog.com
Fax: 781/326-8703
Analog Devices, Inc., 2000
High-Performance Driver/Comparator
Active Load on a Single Chip
FUNCTIONAL BLOCK DIAGRAM
DRIVER
COMPARATOR
46
V/I
V/I
ACTIVE LOAD
1.0 A/K
V
CC
V
CC
51
V
CC
52
34
V
CC
V
EE
39
V
EE
40
V
EE
V
EE
41
32
AD53509
VHDCPL
V
OUT
VLDCPL
39nF
CHDCPL
39nF
CLDCPL
2,5,8
VCCO
9,33,44,46,48
PWRGND
HQGND2
HQGND
VCOMS
THERM
NC
35
36
+1
31
50
49
42
43
38
37
45
47
VH
VTERM
DATA
DATA
IOD
IOD
RLD
RLD
V
L
HCOMP
LEH
LEH
QH
QH
QL
QL
LEL
LEL
LCOMP
VCOMI
IOLC
IOLRTN
IOHRTN
INHL
INHL
IOHC
NC = NO CONNECT
OUT_L
14, 26
FEATURES
250 MHz Operation
Driver/Comparator and Active Load Included
On-Chip Schottky Diode Bridge
52-Lead LQFP Package with Built-In Heat Sink
APPLICATIONS
Automatic Test Equipment
Semiconductor Test Systems
Board Test Systems
Instrumentation and Characterization Equipment
PRODUCT DESCRIPTION
The AD53509 is a single chip that performs the pin electronics
functions of driver, comparator and active load in ATE VLSI
and memory testers. In addition, a Schottky diode bridge for the
active load and a VCOM buffer are included internally.
The driver is a proprietary design that features three active
states: Data High Mode, Data Low Mode and Term Mode as
well as an Inhibit State. This facilitates the implementation of
high speed active termination. The output voltage range is –2 V
to +7 V to accommodate a wide variety of test devices. The
output leakage is typically less than 250 nA over the entire sig-
nal range.
The dual comparator, with an input range equal to the driver
output range, features built-in latches and ECL-compatible
outputs. The outputs are capable of driving 50
signal lines
terminated to –2 V. Signal tracking capability is upwards of
5 V/ns.
The active load can be set for up to 40 mA load current with
less than a 10
μ
A linearity error through the entire set range.
I
OH
, I
OL
and the buffered VCOM are independently adjustable.
On-board Schottky diodes provide high speed switching and low
capacitance.
Also included on the chip is an on-board temperature sensor
whose purpose is to give an indication of the surface tempera-
ture of the DCL. This information can be used to measure
θ
JC
and
θ
JA
or flag an alarm if proper cooling is lost. Output from
the sensor is a current sink that is proportional to absolute tem-
perature. The gain is trimmed to a nominal value of 1.0
μ
A/K.
As an example, the output current can be sensed by using a
10 k
resistor connected from 10 V to the THERM (IOUT) pin.
A voltage drop across the resistor will be developed that equals:
10K
×
1
μ
A/K = 10 mV/K = 2.98 V at room temperature.
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