参数资料
型号: AD586JR-REEL7
厂商: Analog Devices Inc
文件页数: 8/16页
文件大小: 0K
描述: IC VREF SERIES PREC 5V 8-SOIC
产品变化通告: Product Discontinuance 27/Oct/2011
标准包装: 750
基准类型: 串联,精度
输出电压: 5V
容差: ±20mV
温度系数: 25ppm/°C
输入电压: 10.8 V ~ 36 V
通道数: 1
电流 - 静态: 3mA
电流 - 输出: 10mA
工作温度: 0°C ~ 70°C
安装类型: 表面贴装
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
供应商设备封装: 8-SO
包装: 带卷 (TR)
AD586
200 μ V
50 μ S
10V
5V
1mS
C N = 1 μ F
V IN
V OUT
NO C N
Figure 8. Effect of 1 μF Noise Reduction Capacitor on Broadband Noise
Figure 10. Extended Time Scale
TURN-ON TIME
Upon application of power (cold start), the time required for
V IN
10V
1mV
100mS
the output voltage to reach its final value within a specified
error band is defined as the turn-on settling time. Two compo-
nents normally associated with this are the time for the active
circuits to settle, and the time for the thermal gradients on the
chip to stabilize. Figure 9, Figure 10, and Figure 11 show the
turn-on characteristics of the AD586. It shows the settling to be
about 60 μs to 0.01%. Note the absence of any thermal tails
when the horizontal scale is expanded to l ms/cm in Figure 10.
Output turn-on time is modified when an external noise reduc-
tion capacitor is used. When present, this capacitor acts as an
additional load to the current source of the internal Zener
diode, resulting in a somewhat longer turn-on time. In the case
of a 1 μF capacitor, the initial turn-on time is approximately
400 ms to 0.01% (see Figure 11).
V OUT
Figure 11. Turn-On with 1μF C N Characteristics
DYNAMIC PERFORMANCE
The output buffer amplifier is designed to provide the AD586
with static and dynamic load regulation superior to less com-
V IN
V OUT
10V
1mV
plete references.
Many ADCs and DACs present transient current loads to the
reference, and poor reference response can degrade the per-
formance of the converter.
Figure 12, Figure 13, and Figure 14 display the characteristics of
the AD586 output amplifier driving a 0 mA to 10 mA load.
V OUT
20 μ S
3.5V
500 ?
Figure 9. Electrical Turn-On
AD586
V L
5V
0V
Figure 12. Transient Load Test Circuit
Rev. G | Page 8 of 16
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