参数资料
型号: AD7495BR-REEL
厂商: Analog Devices Inc
文件页数: 2/25页
文件大小: 0K
描述: IC ADC 12BIT SRL LP W/REF 8-SOIC
产品变化通告: AD7495 Obsolescence 15/Apr/2011
标准包装: 2,500
位数: 12
采样率(每秒): 1M
数据接口: DSP,MICROWIRE?,QSPI?,串行,SPI?
转换器数目: 1
功率耗散(最大): 10.5mW
电压电源: 单电源
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
供应商设备封装: 8-SOIC
包装: 带卷 (TR)
输入数目和类型: 1 个单端,单极
AD7475/AD7495
Rev. B | Page 9 of 24
ABSOLUTE MAXIMUM RATINGS
TA = 25°C unless otherwise noted.
Table 4.
Parameters
Ratings
VDD to GND
0.3 V to +7 V
VDRIVE to GND
0.3 V to +7 V
Analog Input Voltage to GND
0.3 V to VDD + 0.3 V
Digital Input Voltage to GND
0.3 V to +7 V
VDRIVE to VDD
0.3 V to VDD + 0.3 V
Digital Output Voltage to GND
0.3 V to VDRIVE + 0.3 V
REF IN to GND
0.3 V to VDD + 0.3 V
Input Current to Any Pin Except
Supplies1
±10 mA
Operating Temperature Range
Commercial (A, B Version)
40°C to +85°C
Storage Temperature Range
65°C to +150°C
Junction Temperature
150°C
SOIC, MSOP Package, Power Dissipation
450 mW
θJA Thermal Impedance
157°C/W (SOIC)
205.9°C/W (MSOP)
θJC Thermal Impedance
56°C/W (SOIC)
43.74°C/W (MSOP)
Lead Temperature, Soldering
Vapor Phase (60 sec)
215°C
Infrared (15 sec)
220°C
ESD
4 kV
1 Transient currents of up to 100 mA do not cause SCR latch-up.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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