参数资料
型号: AD7817ARZ-REEL7
厂商: Analog Devices Inc
文件页数: 12/20页
文件大小: 279K
描述: IC ADC 10BIT W/TEMP SNSR 16SOIC
标准包装: 1,000
功能: 温度监控系统(传感器)
传感器类型: 内部
感应温度: -55°C ~ 125°C
精确度: ±2°C
拓扑: ADC,多路复用器,寄存器库
输出类型: MICROWIRE?,QSPI?,SPI?
输出警报:
输出风扇:
电源电压: 2.7 V ~ 5.5 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 16-SOIC(0.154",3.90mm 宽)
供应商设备封装: 16-SOIC
包装: 带卷 (TR)
REV. C
12
AD7816/AD7817/AD7818
1.2V
REF
IN
SW1
2.5V
EXTERNAL
REFERENCE
DETECT
BUFFER
1.2V
26k
24k
Figure 9.  On-Chip Reference
ADC TRANSFER FUNCTION
The output coding of the AD7816, AD7817, and AD7818 is
straight binary. The designed code transitions occur at succes-
sive integer LSB values (i.e., 1 LSB, 2 LSBs, etc.). The LSB
size is = 2.5 V/1024 = 2.44 mV. The ideal transfer characteristic
is shown in Figure 10 below.
ANALOG INPUT
0V
1LSB
+2.5V"1LSB
1LSB=2.5/1024
2.44mV
111...111
111...110
111...000
011...111
000...010
000...001
000...000
Figure 10.  ADC Transfer Function
TEMPERATURE MEASUREMENT
The on-chip temperature sensor can be accessed via multiplexer
Channel 0, i.e., by writing 0 0 0 to the channel address register.
The temperature is also the power on default selection. The
transfer characteristic of the temperature sensor is shown in
Figure 11 below. The result of the 10-bit conversion on Chan-
nel 0 can be converted to degrees centigrade by using the fol-
lowing equation.
T
AMB
 = 103?SPAN class="pst AD7818ARZ_2284549_7">C + (ADC Code/4)
55癈
125癈
192Dec
912Dec
ADC CODE
Figure 11.  Temperature Sensor Transfer Characteristic
A
IN
D1
C1
3pF
V
DD
D2
C2
4pF
V
BALANCE
CONVERT PHASE - SWITCH OPEN
TRACK PHASE - SWITCH CLOSED
R1
1k
Figure 7.  Equivalent Analog Input Circuit
DC Acquisition Time
The ADC starts a new acquisition phase at the end of a conver-
sion and ends on the falling edge of the CONVST signal. At the
end of a conversion a settling time is associated with the sam-
pling circuit. This settling time lasts approximately 100 ns. The
analog signal on V
IN +
 is also being acquired during this settling
time. Therefore, the minimum acquisition time needed is
approximately 100 ns.
Figure 8 shows the equivalent charging circuit for the sampling
capacitor when the ADC is in its acquisition phase. R2 repre-
sents the source impedance of a buffer amplifier or resistive
network, R1 is an internal multiplexer resistance and C1 is the
sampling capacitor.
V
IN
C1
3pF
R2
R1
1k
Figure 8.  Equivalent Sampling Circuit
During the acquisition phase the sampling capacitor must be
charged to within a 1/2 LSB of its final value. The time it takes
to charge the sampling capacitor (T
CHARGE
) is given by the
following formula:
T
CHARGE
 = 7.6 ?(R2 + 1 k&) ?3 pF
For small values of source impedance, the settling time associ-
ated with the sampling circuit (100 ns) is, in effect, the acquisi-
tion time of the ADC. For example, with a source impedance (R2)
of 10 & the charge time for the sampling capacitor is approxi-
mately 23 ns. The charge time becomes significant for source
impedances of 1 k& and greater.
AC Acquisition Time
In ac applications it is recommended to always buffer analog
input signals. The source impedance of the drive circuitry must
be kept as low as possible to minimize the acquisition time of
the ADC. Large values of source impedance will cause the THD
to degrade at high throughput rates.
ON-CHIP REFERENCE
The AD7816, AD7817, and AD7818 have an on-chip 1.2 V
band gap reference that is gained up to give an output of 2.5 V.
The on-chip reference is selected by connecting the REF
IN
 pin
to analog ground. This causes SW1 (see Figure 9) to open and
the reference amplifier to power up during a conversion. There-
fore, the on-chip reference is not available externally. An external
2.5 V reference can be connected to the REF
IN
 pin. This has the
effect of shutting down the on-chip reference circuitry and reduc-
ing I
DD
 by about 0.25 mA.
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