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参数资料
| 型号： | AD7847ARZ-REEL |
| 厂商： | Analog Devices Inc |
| 文件页数： | 5/12页 |
| 文件大小： | 0K |
| 描述： | IC DAC 12BIT DUAL MULT 24-SOIC |
| 产品培训模块： | Data Converter Fundamentals DAC Architectures |
| 标准包装： | 1,000 |
| 设置时间： | 4µs |
| 位数： | 12 |
| 数据接口： | 并联 |
| 转换器数目： | 2 |
| 电压电源： | 双 ± |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 24-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装： | 24-SOIC W |
| 包装： | 带卷 (TR) |
| 输出数目和类型： | 2 电压，单极；2 电压，双极 |
| 采样率（每秒）： | 250k |
REV. C
–2–
AD7837/AD7847–SPECIFICATIONS1 (V
DD = +15 V
5%, VSS = –15 V
5%, AGNDA = AGNDB = DGND
= O V. VREFA = VREFB = +10 V, RL = 2 k , CL = 100 pF [VOUT connected to RFB AD7837]. All specifications TMIN to TMAX unless otherwise noted.)
Parameter
A Version
B Version
S Version
Units
Test Conditions/Comments
STATIC PERFORMANCE
Resolution
12
Bits
Relative Accuracy
2
±1
±1/2
±1
LSB max
Differential Nonlinearity
2
±1
LSB max
Guaranteed Monotonic
Zero Code Offset Error2
@ +25
°C
±2
mV max
DAC Latch Loaded with All 0s
TMIN to TMAX
±4
±3
±4
mV max
Temperature Coefficient =
±5 V/°C typ
Gain Error2
@ +25
°C
±4
±2
±4
LSB max
DAC Latch Loaded with All 1s
TMIN to TMAX
±5
±3
±5
LSB max
Temperature Coefficient =
±2 ppm of
FSR/
°C typ
REFERENCE INPUTS
VREF Input Resistance
8/13
k
min/max
Typical Input Resistance = 10 k
VREFA, VREFB Resistance Matching
±2
% max
Typically
±0.25%
DIGITAL INPUTS
Input High Voltage, VINH
2.4
V min
Input Low Voltage, VINL
0.8
V max
Input Current
±1
A max
Digital Inputs at 0 V and VDD
Input Capacitance
3
8
pF max
ANALOG OUTPUTS
DC Output Impedance
0.2
typ
Short Circuit Current
11
mA typ
VOUT Connected to AGND
POWER REQUIREMENTS
4
VDD Range
14.25/15.75
V min/max
VSS Range
–14.25/–15.75
–14.25/–15.75 –14.25/–15.75
V min/max
Power Supply Rejection
Gain/VDD
±0.01
% per % max
VDD = 15 V
± 5%, VREF = –10 V
Gain/V
SS
±0.01
% per % max
VSS = –15 V
± 5%, V
REF = +10 V
IDD
8
mA max
Outputs Unloaded. Inputs at Thresholds.
Typically 5 mA
ISS
6
mA max
Outputs Unloaded. Inputs at Thresholds.
Typically 3 mA
AC CHARACTERISTICS
2, 3
Voltage Output Settling Time
3
s typ
Settling Time to Within
±1/2 LSB of Final
55
5
s max
Value. DAC Latch Alternately Loaded
with All 0s and All 1s
Slew Rate
11
V/
s typ
Digital-to-Analog Glitch Impulse
10
nV secs typ
1 LSB Change Around Major Carry
Channel-to-Channel Isolation
VREFA to VOUTB
–95
dB typ
VREFA = 20 V p-p, 10 kHz Sine Wave.
DAC Latches Loaded with All 0s
VREFB to VOUTA
–95
dB typ
VREFB = 20 V p-p, 10 kHz Sine Wave.
DAC Latches Loaded with All 0s
Multiplying Feedthrough Error
–90
dB typ
VREF = 20 V p-p, 10 kHz Sine Wave.
DAC Latch Loaded with All 0s
Unity Gain Small Signal BW
750
kHz typ
VREF = 100 mV p-p Sine Wave. DAC
Latch Loaded with All 1s
Full Power BW
175
kHz typ
VREF = 20 V p-p Sine Wave. DAC
Latch Loaded with All 1s
Total Harmonic Distortion
–88
dB typ
VREF = 6 V rms, 1 kHz. DAC Latch
Loaded with All 1s
Digital Crosstalk
1
nV secs typ
Code Transition from All 0s to All 1s and
Vice Versa
Output Noise Voltage @ +25
°C
See Typical Performance Graphs
(0.1 Hz to 10 Hz)
2
V rms typ
Amplifier Noise and Johnson Noise of RFB
Digital Feedthrough
1
nV secs typ
NOTES
1Temperature ranges are as follows: A, B Versions, –40
°C to +85°C; S Version, –55°C to +125°C.
2See Terminology.
3Guaranteed by design and characterization, not production tested.
4The Devices are functional with V
DD/VSS =
± 12 V (See typical performance graphs.).
Specifications subject to change without notice.
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相关代理商/技术参数 |
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