参数资料
| 型号： | AD7874ANZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 11/16页 |
| 文件大小： | 0K |
| 描述： | IC DAS 12BIT 4CH LC2MOS 28-DIP |
| 标准包装： | 1 |
| 类型： | 数据采集系统（DAS） |
| 分辨率（位）： | 12 b |
| 采样率（每秒）： | 116k |
| 数据接口： | 并联 |
| 电压电源： | 双 ± |
| 电源电压： | ±5V |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 通孔 |
| 封装/外壳： | 28-DIP（0.600"，15.24mm） |
| 供应商设备封装： | 28-PDIP |
| 包装： | 管件 |
| 产品目录页面： | 776 (CN2011-ZH PDF) |
AD7874
REV. C
–4–
TERMINOLOGY
ACQUISITION TIME
Acquisition Time is the time required for the output of the
track/hold amplifiers to reach their final values, within
±1/2
LSB, after the falling edge of INT (the point at which the track/
holds return to track mode). This includes switch delay time,
slewing time and settling time for a full-scale voltage change.
APERTURE DELAY
Aperture Delay is defined as the time required by the internal
switches to disconnect the hold capacitors from the inputs. This
produces an effective delay in sample timing. It is measured by
applying a step input and adjusting the CONVST input position
until the output code follows the step input change.
APERTURE DELAY MATCHING
Aperture Delay Matching is the maximum deviation in aperture
delays across the four on-chip track/hold amplifiers.
APERTURE JITTER
Aperture Jitter is the uncertainty in aperture delay caused by
internal noise and variation of switching thresholds with signal
level.
DROOP RATE
Droop Rate is the change in the held analog voltage resulting
from leakage currents.
CHANNEL-TO-CHANNEL ISOLATION
Channel-to-Channel Isolation is a measure of the level of
crosstalk between channels. It is measured by applying a full-
scale 1 kHz signal to the other three inputs. The figure given is
the worst case across all four channels.
SNR, THD, IMD
See DYNAMIC SPECIFICATIONS section.
PIN CONFIGURATIONS
DIP and SOIC
V
IN1
V
IN2
V
IN4
V
IN3
REF IN
AGND
DB0 (LSB)
V
DD
V
SS
REF OUT
CLK
DB1
V
DD
DB2
DB11 (MSB)
DB3
DB10
DB4
DB9
DB5
DB8
DB6
DGND
DB7
13
18
1
2
28
27
5
6
7
24
23
22
3
4
26
25
821
920
10
19
11
12
17
16
14
15
TOP VIEW
(Not to Scale)
AD7874
INT
CONVST
RD
CS
LCCC
V
DD
CLK
V
DD
V
IN4
V
IN2
V
IN1
DB9
DB8
DB6
DGND
DB7
REF OUT
REF IN
DB1
AGND
DB0 (LSB)
DB10
DB11 (MSB)
DB4
DB5
V
SS
V
IN3
DB3
DB2
AD7874
27
1
28
226
3
4
25
22
24
23
21
19
20
18
17
12 13
16
14 15
11
10
9
8
7
6
5
TOP VIEW
(Not to Scale)
CONVST
RD
CS
INT
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相关代理商/技术参数 |
参数描述 |
|---|---|
| AD7874ANZ | 制造商:Analog Devices 功能描述:IC 12-BIT ADC |
| AD7874AQ | 功能描述:IC DAS 12BIT 4CH 5V 28-CDIP RoHS:否 类别:集成电路 (IC) >> 数据采集 - ADCs/DAC - 专用型 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:50 系列:- 类型:数据采集系统（DAS） 分辨率（位）:16 b 采样率（每秒）:21.94k 数据接口:MICROWIRE?，QSPI?，串行，SPI? 电压电源:模拟和数字 电源电压:1.8 V ~ 3.6 V 工作温度:-40°C ~ 85°C 安装类型:表面贴装 封装/外壳:40-WFQFN 裸露焊盘 供应商设备封装:40-TQFN-EP（6x6） 包装:托盘 |
| AD7874AR | 功能描述:IC DAS 12BIT 4CH LC2MOS 28-SOIC RoHS:否 类别:集成电路 (IC) >> 数据采集 - ADCs/DAC - 专用型 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:50 系列:- 类型:数据采集系统（DAS） 分辨率（位）:16 b 采样率（每秒）:21.94k 数据接口:MICROWIRE?，QSPI?，串行，SPI? 电压电源:模拟和数字 电源电压:1.8 V ~ 3.6 V 工作温度:-40°C ~ 85°C 安装类型:表面贴装 封装/外壳:40-WFQFN 裸露焊盘 供应商设备封装:40-TQFN-EP（6x6） 包装:托盘 |
| AD7874AR-REEL | 制造商:Analog Devices 功能描述:ADC Single SAR 116ksps 12-bit Parallel 28-Pin SOIC W T/R |
| AD7874AR-REEL7 | 功能描述:IC DAS 12BIT 4CH 5V 28-SOIC RoHS:否 类别:集成电路 (IC) >> 数据采集 - ADCs/DAC - 专用型 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:50 系列:- 类型:数据采集系统（DAS） 分辨率（位）:16 b 采样率（每秒）:21.94k 数据接口:MICROWIRE?，QSPI?，串行，SPI? 电压电源:模拟和数字 电源电压:1.8 V ~ 3.6 V 工作温度:-40°C ~ 85°C 安装类型:表面贴装 封装/外壳:40-WFQFN 裸露焊盘 供应商设备封装:40-TQFN-EP（6x6） 包装:托盘 |
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