参数资料
型号: AD8132ARZ-RL
厂商: Analog Devices Inc
文件页数: 14/33页
文件大小: 0K
描述: IC AMP DIFF LDIST LP 70MA 8SOIC
标准包装: 2,500
放大器类型: 差分
电路数: 1
输出类型: 差分
转换速率: 1200 V/µs
-3db带宽: 360MHz
电流 - 输入偏压: 3µA
电压 - 输入偏移: 1000µV
电流 - 电源: 12mA
电流 - 输出 / 通道: 70mA
电压 - 电源,单路/双路(±): 2.7 V ~ 11 V,±1.35 V ~ 5.5 V
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
供应商设备封装: 8-SO
包装: 带卷 (TR)
AD8132
Rev. I | Page 20 of 32
TEST CIRCUITS
0.1F
348
49.9
24.9
348
499
CF
01
03
5-
00
5
Figure 56. Basic Test Circuit, G = +1
0.1F
499
49.9
24.9
1000
200
01
035
-01
4
Figure 57. Basic Test Circuit, G = +2
0.1F
499
49.9
24.9
RF
200
RF
01
03
5
-01
9
Figure 58. Test Circuit for Various Gains
0.1F
49.9
24.9
RF
RG
RL
G = +1: RF = RG = 348, RL = 249 (RL, dm = 498)
G = +2: RF = 1000, RG = 499, RL = 100 (RL, dm = 200)
01
03
5-
02
1
Figure 59. Test Circuit for Output Balance
0.1F
348
49.9
24.9
348
453
24.9
CL
01
03
5-
0
51
Figure 60. Test Circuit for Capacitor Load Drive
348
49.9
348
249
VO, dm
VO, cm
NOTES
RESISTORS MATCHED TO 0.01%.
01
03
5-
0
54
Figure 61. CMRR Test Circuit
0.1F
348
49.9
24.9
348
300
2:1 TRANSFORMER
LPF
HPF
ZIN = 50
01
03
5-
02
3
Figure 62. Harmonic Distortion Test Circuit, G = +1, RL, dm = 800 Ω
0.1F
499
49.9
24.9
1000
300
2:1 TRANSFORMER
LPF
HPF
ZIN = 50
01
03
5-
03
2
Figure 63. Harmonic Distortion Test Circuit, G = +2, RL, dm = 800 Ω
相关PDF资料
PDF描述
7010.9820.63 FUSE 1.5A 125V FAST F PCB SMD
7010.9760.63 FUSE 125MA 125V FAST F PCB SMD
7010.9790.63 FUSE 500MA 125V FAST F PCB SMD
AD8132ARMZ-REEL IC AMP DIFF LDIST LP 70MA 8MSOP
7010.9800.63 FUSE 750MA 125V FAST F PCB SMD
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