参数资料
| 型号： | AD8280WASTZ-RL |
| 厂商： | Analog Devices Inc |
| 文件页数： | 21/24页 |
| 文件大小： | 0K |
| 描述： | IC LI-ION BATT MON 48LQFP |
| 标准包装： | 2,000 |
| 功能： | 电池监控器 |
| 电池化学： | 锂离子（Li-Ion） |
| 电源电压： | 6 V ~ 30 V |
| 工作温度： | -40°C ~ 105°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 48-LQFP |
| 供应商设备封装： | 48-LQFP（7x7） |
| 包装： | 带卷 (TR) |
| 配用： | AD8280-EVALZ-ND - BOARD EVAL FOR AD8280 |
AD8280
NORMAL OPERATION
UNALARMED
AIOUTxx/AVOUTxx
ALARMED
AIOUTxx/AVOUTxx
DURING SELF-TEST MODE
TESTI
AIOUTxx/AVOUTxx
TEST OK
AIOUTxx/AVOUTxx
TEST FAILS
AIOUTxx/AVOUTxx
ALARMED
TEST OK
HIGH AT FALLING EDGE OF TESTI:
PART FAILS SELF-TEST
Figure 51. Timing Diagram for Alarms at AIOUTxx and AVOUTxx
LOW AT FALLING EDGE OF TESTI:
PART PASSES SELF-TEST
Self-Test and Alarm Conditions
If an alarm occurs just prior to or just after the self-test pulse is
initiated, the alarm causes the self-test to fail. The time span for
Self-Test Timing and Monitoring Strategy
When monitoring the signals for self-test on the AD8280, note
the following items:
this condition depends on the deglitch time.
?
After initiating a self-test of the AD8280 with a rising edge
?
Deglitch time = 0.0 sec. The part fails self-test if an alarm
occurs in the time period from 20 ms before the leading
on the TESTI pin, the alarm appearing at the AVOUTxx
pin remains valid up to t RE max.
edge of the self-test pulse to 20 ms after the leading edge
of the self-test pulse.
?
When the rising edge of the TESTI pulse occurs, the user
should monitor the AVOUTxx pin to make sure that it is
?
Deglitch time > 0.0 sec. The part fails self-test if an alarm
in the high state after the t RE max time has elapsed.
occurs in the time period from 120 ms before the leading
edge of the self-test pulse to 120 ms after the leading edge
of the self-test pulse.
Therefore, in the unusual circumstance that the part fails self-
test and there is an alarm condition state after the self-test, it
is recommended that the user retest the part to ensure that
an alarm did not occur just prior to or just after initiating the
self-test.
The self-test works when the part is in the shared alarm mode
?
?
After the t ST max time has elapsed, the user can verify that
the AVOUTxx pin has changed to the low state, indicating
that the part or parts passed the self-test. The user must
also ensure that the minimum length of the TESTI pulse
is greater than t ST max. The status of the self-test on the
AVOUTxx pin is valid until t STV min after the trailing edge
of the TESTI pulse.
The alarm state is valid again t FE max after the trailing edge
of the pulse.
or in the separate alarm mode. When the part is in the separate
alarm mode, the self-test status on an output pertains only to
that portion of the internal circuit relevant to the condition being
monitored: overvoltage, undervoltage, or overtemperature.
Rev. C | Page 21 of 24
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