AD9060
–3–
REV. A
T est
Level
AD9060JE /JZ
T yp
AD9060KE /KZ
T yp
Parameter (Conditions)
T emp
Min
Max
Min
Max
Units
DYNAMIC PERFORMANCE
(CONT INUED)
Signal-to-Noise Ratio
6
(Without Harmonics)
f
IN
= 2.3 MHz
f
IN
= 10.3 MHz
f
IN
= 29.3 MHz
Harmonic Distortion
f
IN
= 2.3 MHz
f
IN
= 10.3 MHz
f
IN
= 29.3 MHz
T wo-T one Intermodulation
Distortion Rejection
7
Differential Phase
Differential Gain
+25
°
C
+25
°
C
+25
°
C
I
I
I
54
51
46
56
55
48
54
51
46
58
55
48
dB
dB
dB
+25
°
C
+25
°
C
+25
°
C
I
I
I
61
55
47
65
58
50
61
55
47
65
58
50
dBc
dBc
dBc
+25
°
C
+25
°
C
+25
°
C
V
V
V
70
0.5
1
70
0.5
1
dBc
Degree
%
ENCODE INPUT
Logic “1” Voltage
Logic “0” Voltage
Logic “1” Current
Logic “0” Current
Input Capacitance
Pulse Width (High)
Pulse Width (Low)
Full
Full
Full
Full
+25
°
C
+25
°
C
+25
°
C
VI
VI
VI
VI
V
I
I
–1.1
–1.1
V
V
μ
A
μ
A
pF
ns
ns
–1.5
300
300
–1.5
300
300
150
150
5
150
150
5
6
6
6
6
DIGIT AL OUT PUT S
Logic “1” Voltage
Logic “0” Voltage
Full
Full
VI
VI
–1.1
–1.1
V
V
–1.5
–1.5
POWER SUPPLY
+V
S
Supply Current
+25
°
C
Full
+25
°
C
Full
+25
°
C
Full
VI
VI
VI
VI
VI
VI
420
500
500
180
190
3.3
3.5
420
500
500
180
190
3.3
3.5
mA
mA
mA
mA
W
W
–V
S
Supply Current
150
150
Power Dissipation
2.8
2.8
Power Supply Rejection
Ratio (PSRR)
8
Full
VI
6
10
6
10
mV/V
NOT ES
1
Absolute maximum ratings are limiting values to be applied individually and beyond which the serviceability of the circuit may be impaired. Functional operability is
not necessarily implied. Exposure to absolute maximum rating conditions for an extended period of time may affect device reliability.
2
T ypical thermal impedances (part soldered onto board): 68-pin leaded ceramic chip carrier:
θ
= 1
°
C/W;
θ
= 17
°
C/W (no air flow);
θ
JA
= 15
°
C/W
(air flow = 500 LFM). 68-pin ceramic LCC:
θ
= 2.6
°
C/W;
θ
= 15
°
C/W (no air flow);
θ
= 13
°
C/W (air flow = 500 LFM).
3
3/4
, 1/2
and 1/4
reference ladder taps are driven from dc sources at +0.875 V, 0 V and –0.875 V, respectively. Outputs terminated through 100
to –2.0 V;
C
< 4 pF. Accuracy of the overflow comparator is not tested and not included in linearity specifications.
4
Measured with ANALOG IN = +V
5
Output delay measured as worst-case time from 50% point of the rising edge of ENCODE to 50% point of the slowest rising or falling edge of D
0
–D
9
. Output skew
measured as worst-case difference in output delay among D
–D
.
6
RMS signal to rms noise with analog input signal 1 dB below full scale at specified frequency.
7
Intermodulation measured with analog input frequencies of 2.3 MHz and 3.0 MHz at 7 dB below full scale.
8
Measured as the ratio of the worst-case change in transition voltage of a single comparator for a 5% change m +V
S
or –V
S
.
Specifications subject to change without notice.