参数资料
型号: AD974AR
厂商: Analog Devices Inc
文件页数: 14/20页
文件大小: 0K
描述: IC DAS 16BIT 4CH 200KSPS 28-SOIC
标准包装: 1
类型: 数据采集系统(DAS)
分辨率(位): 16 b
采样率(每秒): 200k
数据接口: 串行
电压电源: 模拟和数字
电源电压: 4.75 V ~ 5.25 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 28-SOIC(0.295",7.50mm 宽)
供应商设备封装: 28-SOIC W
包装: 管件
配用: EVAL-AD974CB-ND - BOARD EVAL FOR AD974
REV. A
–3–
AD974
A Grade
B Grade
Parameter
Conditions
Min
Typ
Max
Min
Typ
Max
Units
DIGITAL OUTPUTS
Data Format
Serial 16 Bits
Data Coding
Straight Binary
VOL
ISINK = 1.6 mA
+0.4
V
VOH
ISOURCE = 500
A+4
+4
V
Output Capacitance
High-Z State
15
pF
Leakage Current
High-Z State
VOUT = 0 V to VDIG
±5
A
POWER SUPPLIES
Specified Performance
VDIG
+4.75
+5
+5.25
+4.75 +5
+5.25
V
VANA
+4.75
+5
+5.25
+4.75 +5
+5.25
V
IDIG
4.5
mA
IANA
14
mA
Power Dissipation
PWRD LOW
120
mW
PWRD HIGH
50
W
TEMPERATURE RANGE
Specified Performance
TMIN to TMAX
–40
+85
–40
+85
°C
NOTES
1LSB means Least Significant Bit. With a
±10 V input, one LSB is 305 V.
2Typical rms noise at worst case transitions and temperatures.
3Full-Scale Error is expressed as the % difference between the actual full-scale code transition voltage and the ideal full-scale transition voltage, and includes the effect
of offset error. For bipolar input, the Full-Scale Error is the worst case of either the –Full-Scale or +Full-Scale code transition voltage errors. For unipolar input
ranges, Full-Scale Error is with respect to the +Full-Scale code transition voltage.
4External 2.5 V reference connected to REF.
5All specifications in dB are referred to a full-scale
±10 V input.
6Full-Power Bandwidth is defined as full-scale input frequency at which Signal-to-(Noise + Distortion) degrades to 60 dB, or 10 bits of accuracy.
7Recovers to specified performance after a 2
× FS input overvoltage.
Specifications subject to change without notice.
TIMING SPECIFICATIONS
Parameter
Symbol
Min
Typ
Max
Units
Convert Pulsewidth
t1
50
ns
R/
C, CS to BUSY Delay
t2
100
ns
BUSY LOW Time
t3
4.0
s
BUSY Delay after End of Conversion
t4
50
ns
Aperture Delay
t5
40
ns
Conversion Time
t6
3.8
4.0
s
Acquisition Time
t7
1.0
s
Throughput Time
t6 + t7
5
s
R/
C Low to DATACLK Delay
t8
220
ns
DATACLK Period
t9
220
ns
DATA Valid Setup Time
t10
50
ns
DATA Valid Hold Time
t11
20
ns
EXT. DATACLK Period
t12
66
ns
EXT. DATACLK HIGH
t13
20
ns
EXT. DATACLK LOW
t14
30
ns
R/
C, CS to EXT. DATACLK Setup Time
t15
20
t12 + 5
ns
R/
C to CS Setup Time
t16
10
ns
EXT. DATACLK to SYNC Delay
t17
15
66
ns
EXT. DATACLK to DATA Valid Delay
t18
25
66
ns
CS to EXT. DATACLK Rising Edge Delay
t19
10
ns
Previous DATA Valid after
CS, R/C Low
t20
3.5
s
BUSY to EXT. DATACLK Setup Time
t21
5ns
Final EXT. DATACLK to
BUSY Rising Edge
t22
1.7
s
A0, A1 to
WR1, WR2 Setup Time
t23
10
ns
A0, A1 to
WR1, WR2 Hold Time
t24
10
ns
WR1, WR2 Pulsewidth
t25
50
ns
Specifications subject to change without notic e.
(fS = 200 kHz, VDIG = VANA = +5 V, –40 C to +85 C)
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