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| 型号： | ADM1169ASTZ-RL7 |
| 厂商： | Analog Devices Inc |
| 文件页数： | 20/36页 |
| 文件大小： | 0K |
| 描述： | IC SEQUENCER/SUPERVISOR 32LQFP |
| 标准包装： | 500 |
| 系列： | Super Sequencer® |
| 应用： | 电源监控器，序列发生器 |
| 输入电压： | 3 V ~ 14.4 V |
| 电源电压： | 3 V ~ 14.4 V |
| 电流 - 电源： | 4.2mA |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 32-LQFP |
| 供应商设备封装： | 32-LQFP（7x7） |
| 包装： | 带卷 (TR) |
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ADM1169
Monitoring Fault Detector
The monitoring fault detector block is used to detect a failure on an
input. The logical function implementing this is a wide OR gate
that can detect when an input deviates from its expected condition.
The clearest demonstration of the use of this block is in the
PWRGD state, where the monitor block indicates that a failure
on one or more of the VPx, VXx, or VH inputs has occurred.
No programmable delay is available in this block because the
triggering of a fault condition is likely to be caused by a supply
falling out of tolerance. In this situation, the device needs to react as
quickly as possible. Some latency occurs when moving out of
this state because it takes a finite amount of time (~20 μs) for the
state configuration to download from EEPROM into the SE.
MONITORING FAULT
DETECTOR
1-BIT FAULT
DETECTOR
Data Sheet
FAULT AND STATUS REPORTING
The ADM1169 has a fault latch for recording faults. Two registers,
FSTAT1 and FSTAT2, are set aside for this purpose. A single bit
is assigned to each input of the device, and a fault on that input
sets the relevant bit. The contents of the fault register can be
read out over the SMBus to determine which input(s) faulted.
The fault register can be enabled/disabled in each state. To latch
data from one state, ensure that the fault latch is disabled in the
following state. This ensures that only real faults are captured
and not, for example, undervoltage conditions that may be present
during a power-up or power-down sequence.
The ADM1169 also has a number of status registers. These include
more detailed information, such as whether an undervoltage or
overvoltage fault is present on a particular input. The status
registers also include information on ADC limit faults.
There are two sets of these registers with different behaviors. The
first set of status registers is not latched in any way and, therefore,
VP1
SUPPLY FAULT
DETECTION
FAULT
MASK
SENSE
1-BIT FAULT
DETECTOR
can change at any time in response to changes on the inputs.
These registers provide information such as the UV and OV
state of the inputs, the digital state of the GPI VXx inputs, and
also the ADC warning limit status.
The second set of registers update each time the sequence engine
changes state and are latched until the next state change. The
VX4
LOGIC INPUT CHANGE
OR FAULT DETECTION
MASK
SENSE
FAULT
second set of registers provides the same information as the first
set, but in a more compact form. The reason for this is that these
registers are used by the black box feature when writing status
information for the previous state into EEPROM.
1-BIT FAULT
DETECTOR
See the AN-721 Application Note for full details about the
WARNINGS
FAULT
ADM1169 registers.
NONVOLATILE BLACK BOX FAULT RECORDING
MASK
Figure 29. Monitoring Fault Detect or Block Diagram
Timeout Detector
The timeout detector allows the user to trap a failure to ensure
proper progress through a power-up or power-down sequence.
In the sample application shown in Figure 28, the timeout next-
state transition is from the EN3V3 and EN2V5 states. For the
EN3V3 state, the signal 3V3ON is asserted on the PDO1 output
pin upon entry to this state to turn on a 3.3 V supply.
A section of EEPROM, from Address 0xF900 to Address 0xF9FF, is
provided that by default can be used to store user-defined settings
and information. Part of this section of EEPROM, Address 0xF980
to Address 0xF9FF, can instead be used to store up to 16 fault records.
Any sequencing engine state can be designated as a black box write
state. Each time the sequence engine enters that state, a fault record
is written into EEPROM. The fault record provides a snapshot of
the entire ADM1169 state at the point in time when the last state
was exited, just prior to entering the designated black box write
state. A fault record contains the following information:
This supply rail is connected to the VP2 pin, and the sequence
detector looks for the VP2 pin to go above its undervoltage
threshold, which is set in the supply fault detector (SFD)
attached to that pin.
The power-up sequence progresses when this change is detected.
If, however, the supply fails (perhaps due to a short circuit over-
loading this supply), the timeout block traps the problem. In this
example, if the 3.3 V supply fails within 10 ms, the SE moves to
the DIS3V3 state and turns off this supply by bringing PDO1
?
?
?
?
?
?
?
A flag bit set to 0 after the fault record has been written.
The state number of the previous state prior to the fault
record write state.
Did a sequence, timeout, or monitor condition cause the
previous state to exit?
UVSTATx and OVSTATx input comparator status.
VXx GPISTAT status.
LIMSTATx status.
A checksum byte.
low. It also indicates that a fault has occurred by taking PDO3
high. Timeout delays of 100 μs to 400 ms can be programmed.
Rev. A | Page 20 of 36
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相关代理商/技术参数 |
参数描述 |
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| ADM1170 | 制造商:AD 制造商全称:Analog Devices 功能描述:1.6 V to 16.5 V Hot Swap Controller with Soft Start |
| ADM1170-1AUJZ-RL7 | 功能描述:IC CTRLR HOTSWAP 16.5V TSOT-23-8 RoHS:是 类别:集成电路 (IC) >> PMIC - 热交换 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:119 系列:- 类型:热交换控制器 应用:通用型，PCI Express? 内部开关:无 电流限制:- 电源电压:3.3V，12V 工作温度:-40°C ~ 85°C 安装类型:表面贴装 封装/外壳:80-TQFP 供应商设备封装:80-TQFP（12x12） 包装:托盘 产品目录页面:1423 (CN2011-ZH PDF) |
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| ADM1171-1AUJ | 制造商:Analog Devices 功能描述:ADI HOT SWAP CONTROLLER - Bulk |
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