参数资料
型号: ADM1181AARWZ-REEL
厂商: ANALOG DEVICES INC
元件分类: 通用总线功能
英文描述: EMI/EMC-Compliant, +-15 kV, ESD-Protected RS-232 Line Drivers/Receivers
中文描述: DUAL LINE TRANSCEIVER, PDSO16
封装: LEAD FREE, MS-013AA, SOIC-16
文件页数: 4/16页
文件大小: 244K
代理商: ADM1181AARWZ-REEL
ADM202E/ADM1181A
ABSOLUTE MAXIMUM RATINGS
T
A
= 25°C, unless otherwise noted.
Table 2.
Parameter
V
CC
V+
V–
Input Voltages
T
IN
R
IN
Output Voltages
T
OUT
R
OUT
Short-Circuit Duration
T
OUT
Power Dissipation N-16
(Derate 6 mW/°C Above 50°C)
θ
JA
, Thermal Impedance
Power Dissipation R-16
(Derate 6 mW/°C Above 50°C)
θ
JA
, Thermal Impedance
Power Dissipation RU-16
(Derate 6 mW/°C Above 50°C)
θ
JA
, Thermal Impedance
Operating Temperature Range
Industrial (A Version)
Storage Temperature Range
Lead Temperature (Soldering, 10 sec)
ESD Rating (MIL-STD-883B) (I/O Pins)
ESD Rating (IEC1000-4-2 Air) (I/O Pins)
ESD Rating (IEC1000-4-2 Contact)
(I/O Pins)
EFT Rating (IEC1000-4-4) (I/O Pins)
Rev. C | Page 4 of 16
Values
0.3 V to +6 V
(V
CC
0.3 V) to +14 V
+0.3 V to 14 V
0.3 V to (V+, +0.3 V)
±30 V
±15 V
–0.3 V to (V
CC
+ 0.3 V)
Continuous
450 mW
117°C/W
450 mW
158°C/W
500 mW
158°C/W
–40°C to +85°C
–65°C to +150°C
300°C
±15 kV
±15 kV
±8 kV
±2 kV
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may
affect device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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