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参数资料
| 型号： | ADM14185E |
| 厂商： | Analog Devices, Inc. |
| 英文描述： | RS-232 Line Drivers/Receivers(±15kV ESD保护,RS-232线驱动器/接收器) |
| 中文描述： | RS - 232线驱动器/接收器（± 15kV的ESD保护和RS - 232线驱动器/接收器） |
| 文件页数： | 10/13页 |
| 文件大小： | 343K |
| 代理商： | ADM14185E |
ADM14185E
REV. B 08/97
10
DATA
TECHNICAL
2. Temporary degradation or loss of function which is self-
recoverable when the interfering signal is removed.
3. Temporary degradation or loss of function which requires op-
erator intervention or system reset when the interfering signal
is removed.
4. Degradation or loss of function which is not recoverable due
to damage.
The ADM14185E easily meets Classification 1 at the most
stringent (Level 3) requirement. In fact field strengths up to 30 V/m
showed no performance degradation and error-free data
transmission continued even during irradiation.
The ADM14185E has been tested under worst case conditions
using unshielded cables and meet Classification 2. Data trans-
mission during the transient condition is corrupted but it may be
resumed immediately following the EFT event without user
intervention.
R
C
R
M
C
C
HIGH
VOLTAGE
SOURCE
L
Z
S
C
D
50
OUTPUT
Figure 25. IEC1000-4-4 Fast Transient Generator
IEC1000-4-3 RADIATED IMMUNITY
IEC1000-4-3 (previously IEC801-3) describes the mea-
surement method and defines the levels of immunity to
radiated electromagnetic fields. It was originally intended
to simulate the electromagnetic fields generated by
portable radio transceivers or any other device which
energy. Its scope has since been broadened to include
spurious EM energy which can be radiated from fluores-
cent lights, thyristor drives, inductive loads, etc.
Testing for immunity involves irradiating the device with
an EM field. There are various methods of achieving this
including use of anechoic chamber, stripline cell, TEM
cell, GTEM cell. A stripline cell consists of two parallel
device under test is placed within the cell and exposed to
the electric field. There are three severity levels having
field strengths ranging from 1 V to 10 V/m. Results are
classified in a similar fashion to those for IEC1000-4-4.
Table VII. Test Severity Levels (IEC1000-4-3)
Field Strength
V/m
Level
1
2
3
1
3
10
The fast transient burst test defined in IEC1000-4-4 simulates
this arcing and its waveform is illustrated in Figure 24. It consists
of a burst of 2.5 kHz to 5 kHz transients repeating at
300 ms intervals. It is specified for both power and data lines.
300ms
15ms
t
V
5ns
0.2/0.4ms
50ns
V
t
Figure 24. IEC1000-4-4 Fast Transient Waveform
Table VI.
V Peak (kV)
V Peak
(kV)
Level
PSU
I-O
1
2
3
4
0.5
1
2
4
0.25
0.5
1
2
A simplified circuit diagram of the actual EFT generator
is illustrated in Figure 25.
The transients are coupled onto the signal lines using an
EFT coupling clamp. The clamp is 1 m long and it
completely surrounds the cable providing maximum
coupling capacitance
(50 pF to 200 pF typ) between the clamp and the cable. High en-
ergy transients are capacitively coupled onto the signal lines. Fast
rise times (5 ns) as specified by the standard result in very effec-
tive coupling. This test is very severe since high voltages are
coupled onto the signal lines. The repetitive transients can often
cause problems where single pulses dont. Destructive latch-up
may be induced due to the high energy content of the transients.
Note that this stress is applied while the interface products are
powered up and are transmitting data. The EFT test applies hun-
dreds of pulses with higher energy than ESD. Worst case tran-
sient current on an I-O line can be as high as 40A.
Test results are classified according to the following:
1. Normal performance within specification limits.
2. Temporary degradation or loss of performance which is self-
recoverable.
3. Temporary degradation or loss of function or performance
which requires operator intervention or system reset.
4. Degradation or loss of function which is not recoverable due
to damage.
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