参数资料
型号: ADR03WARZ-RL
厂商: Analog Devices Inc
文件页数: 5/20页
文件大小: 0K
描述: IC VREF SERIES PREC 2.5V 8SOIC
标准包装: 2,500
基准类型: 串联,精度
输出电压: 2.5V
容差: ±0.2%
温度系数: 10ppm/°C
输入电压: 4.5 V ~ 26 V
通道数: 1
电流 - 静态: 1mA
电流 - 输出: 10mA
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
供应商设备封装: 8-SO
包装: 带卷 (TR)
Data Sheet
ADR01/ADR02/ADR03/ADR06
ADR02 ELECTRICAL CHARACTERISTICS
V IN = 7.0 V to 36.0 V, V IN = 7.0 V to 26.0 V for ADR02WARZ, T A = 25°C, unless otherwise noted.
Table 3.
Parameter
OUTPUT VOLTAGE
INITIAL ACCURACY
Symbol
V O
V OERR
Conditions
A and C grades
A and C grades
Min
4.995
Typ
5.000
Max
5.005
5
Unit
V
mV
0.1
%
OUTPUT VOLTAGE
INITIAL ACCURACY
V O
V OERR
B grade
B grade
4.997
5.000
5.003
3
V
mV
0.06
%
TEMPERATURE COEFFICIENT
T CVO
A grade, 8-lead SOIC, –40°C < T A < +125°C
3
10
ppm/°C
A grade, 5-lead TSOT, –40°C < T A < +125°C
A grade, 5-lead SC70, –40°C < T A < +125°C
A grade, 5-lead SC70, –55°C < T A < +125°C
25
25
30
ppm/°C
ppm/°C
ppm/°C
B grade, 8-lead SOIC, –40°C < T A < +125°C
B grade, 5-lead TSOT, –40°C < T A < +125°C
B grade, 5-lead SC70, –40°C < T A < +125°C
C grade, 8-lead SOIC, –40°C < T A < +125°C
1
10
3
9
9
40
ppm/°C
ppm/°C
ppm/°C
ppm/°C
DROPOUT VOLTAGE
V DO
2
V
LINE REGULATION
?V O /?V IN
V IN = 7.0 V to 36.0 V, V IN = 7.0 V to 26.0 V for
7
30
ppm/V
ADR02WARZ, –40°C < T A < +125°C
V IN = 7.0 V to 36.0 V, –55°C < T A < +125°C
7
40
ppm/V
LOAD REGULATION
?V O /?I LOAD
I LOAD = 0 mA to 10 mA, –40°C < T A < +125°C,
40
70
ppm/mA
V IN = 10.0 V
I LOAD = 0 mA to 10 mA, –55°C < T A < +125°C,
45
80
ppm/mA
V IN = 10.0 V
QUIESCENT CURRENT
VOLTAGE NOISE
VOLTAGE NOISE DENSITY
TURN-ON SETTLING TIME
LONG-TERM STABILITY 1
OUTPUT VOLTAGE HYSTERESIS
I IN
e N p-p
e N
t R
?V O
?V O_HYS
No load, –40°C < T A < +125°C
0.1 Hz to 10.0 Hz
1 kHz
1000 hours
0.65
10
230
4
50
70
1
mA
μV p-p
nV/√Hz
μs
ppm
ppm
–55°C < T A < +125°C
80
ppm
RIPPLE REJECTION RATIO
SHORT CIRCUIT TO GND
RRR
I SC
f IN = 10 kHz
–75
30
dB
mA
TEMPERATURE SENSOR
Voltage Output at TEMP Pin
Temperature Sensitivity
V TEMP
TCV TEMP
550
1.96
mV
mV/°C
1
The long-term stability specification is noncumulative. The drift in subsequent 1000 hour periods is significantly lower than in the first 1000 hour period.
Rev. R | Page 5 of 20
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