参数资料
型号: ADUC7128BSTZ126
厂商: Analog Devices Inc
文件页数: 56/92页
文件大小: 0K
描述: IC DAS MCU ARM7 ADC/DDS 64-LQFP
产品培训模块: Direct Digital Synthesis Tutorial Series (1 of 7): Introduction
标准包装: 1
系列: MicroConverter® ADuC7xxx
核心处理器: ARM7
芯体尺寸: 16/32-位
速度: 41.78MHz
连通性: I²C,SPI,UART/USART
外围设备: PLA,POR,PWM,PSM,温度传感器,WDT
输入/输出数: 28
程序存储器容量: 126KB(63K x 16)
程序存储器类型: 闪存
RAM 容量: 8K x 8
电压 - 电源 (Vcc/Vdd): 3 V ~ 3.6 V
数据转换器: A/D 10x12b; D/A 1x10b
振荡器型: 内部
工作温度: -40°C ~ 125°C
封装/外壳: 64-LQFP
包装: 托盘
配用: EVAL-ADUC7128QSPZ-ND - KIT DEV FOR ADUC7128
ADuC7128/ADuC7129
Rev. 0 | Page 6 of 92
Parameter
Min
Typ
Max
Unit
Test Conditions/Comments
LOGIC INPUTS3
All logic inputs, including XCLKI and XCLKO
VINL, Input Low Voltage
0.8
V
VINH, Input High Voltage
2.0
V
Quadrature Encoder Inputs
S1/S2/CLR (Schmitt-Triggered Inputs)
VT+
1.65
V
VT
1.2
V
VT+ VT
0.75
V
LOGIC OUTPUTS9
VOH, Output High Voltage
IOVDD
400 mV
V
ISOURCE = 1.6 mA
VOL, Output Low Voltage
0.4
V
ISINK = 1.6 mA
CRYSTAL INPUTS XCLKI and XCLKO
VINL, Input Low Voltage
1.1
V
Logic inputs, XCLKI only
VINH, Input High Voltage
1.7
V
Logic inputs, XCLKI only
XCLKI, Input Capacitance
20
pF
XCLKO, Output Capacitance
20
pF
MCU CLOCK RATE (PLL)
Eight programmable core clock selections
within this range
326.4
kHz
(32.768 kHz x 1275)/128
41.77920
MHz
(32.768 kHz x 1275)/1
INTERNAL OSCILLATOR
32.768
kHz
Tolerance
±3
%
40°C to 85°C
±4
%
85°C to 125°C only
STARTUP TIME
Core clock = 41.78 MHz
At Power-On
70
ms
From Sleep Mode
1.6
ms
From Stop Mode
1.6
ms
PROGRAMMABLE LOGIC ARRAY (PLA)
Pin Propagation Delay
12
ns
From input pin to output pin
Element Propagation Delay
2.5
ns
POWER REQUIREMENTS
Power Supply Voltage Range
IOVDD, AVDD, and DACVDD (Supply
Voltage to Chip)
3.0
3.6
V
LVDD (Regulator Output from Chip)
2.5
2.6
2.7
V
Power Supply Current10, 11
Normal Mode
15
19
mA
5.22 MHz clock
42
49
mA
41.78 MHz clock
Additional Line Driver Tx Supply
Current
30
mA
691 kHz, maximum load (see Figure 2)
Pause Mode
37
mA
41.78 MHz clock
Sleep Mode
0.3
3.6
mA
External crystal or internal OSC ON
1 All ADC channel specifications are guaranteed during normal MicroConverter core operation.
2 Apply to all ADC input channels.
3 Not production tested; supported by design and/or characterization of data on production release.
4 Measured using an external AD845 op amp as an input buffer stage, as shown in Figure 42. Based on external ADC system components.
5 The input signal can be centered on any dc common-mode voltage (VCM), as long as this value is within the ADC voltage input range specified.
6 When using an external reference input pin, the internal reference must be disabled by setting the LSB in the REFCON memory mapped register to 0.
7 Endurance is qualified as per JEDEC Std. 22 Method A117 and measured at 40°C, +25°C, and +85°C.
8 Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Std. 22 Method A117. Retention lifetime derates with junction temperature.
9 Test carried out with a maximum of eight I/Os set to a low output level.
10 Power supply current consumption is measured in normal, pause, and sleep modes under the following conditions: normal mode = 3.6 V supply, pause mode = 3.6 V
supply, sleep mode = 3.6 V supply.
11 IOVDD power supply current decreases typically by 2 mA during a Flash/EE erase cycle.
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