参数资料
型号: AGLP030V5-CS289I
厂商: Microsemi SoC
文件页数: 70/134页
文件大小: 0K
描述: IC FPGA IGLOO PLUS 30K 289-CSP
标准包装: 152
系列: IGLOO PLUS
逻辑元件/单元数: 792
输入/输出数: 120
门数: 30000
电源电压: 1.425 V ~ 1.575 V
安装类型: 表面贴装
工作温度: -40°C ~ 85°C
封装/外壳: 289-TFBGA,CSBGA
供应商设备封装: 289-CSP(14x14)
IGLOO PLUS DC and Switching Characteristics
2-26
Revision 16
The length of time an I/O can withstand IOSH/IOSL events depends on the junction temperature. The
reliability data below is based on a 3.3 V, 12 mA I/O setting, which is the worst case for this type of
analysis.
For example, at 100°C, the short current condition would have to be sustained for more than six months
to cause a reliability concern. The I/O design does not contain any short circuit protection, but such
protection would only be needed in extremely prolonged stress conditions.
Table 2-31 Duration of Short Circuit Event before Failure
Temperature
Time before Failure
–40°C
> 20 years
0°C
> 20 years
25°C
> 20 years
70°C
5 years
85°C
2 years
100°C
6 months
Table 2-32 Schmitt Trigger Input Hysteresis
Hysteresis Voltage Value (Typ.) for Schmitt Mode Input Buffers
Input Buffer Configuration
Hysteresis Value (typ.)
3.3 V LVTTL/LVCMOS (Schmitt trigger mode)
240 mV
2.5 V LVCMOS (Schmitt trigger mode)
140 mV
1.8 V LVCMOS (Schmitt trigger mode)
80 mV
1.5 V LVCMOS (Schmitt trigger mode)
60 mV
1.2 V LVCMOS (Schmitt trigger mode)
40 mV
Table 2-33 I/O Input Rise Time, Fall Time, and Related I/O Reliability
Input Buffer
Input Rise/Fall
Time (min.)
Input Rise/Fall Time
(max.)
Reliability
LVTTL/LVCMOS (Schmitt trigger
disabled)
No requirement
10 ns *
20 years (100°C)
LVTTL/LVCMOS (Schmitt trigger
enabled)
No requirement
No requirement, but
input noise voltage
cannot exceed Schmitt
hysteresis.
20 years (100°C)
Note: *The maximum input rise/fall time is related to the noise induced into the input buffer trace. If the
noise is low, then the rise time and fall time of input buffers can be increased beyond the
maximum value. The longer the rise/fall times, the more susceptible the input signal is to the board
noise. Microsemi recommends signal integrity evaluation/characterization of the system to ensure
that there is no excessive noise coupling into input signals.
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