参数资料
型号: AP431G-13
厂商: Diodes Inc
文件页数: 4/17页
文件大小: 0K
描述: IC VREF SHUNT PREC ADJ 8-SOP
产品变化通告: Copper Bond Wire Change 13/Jan/2012
标准包装: 2,500
基准类型: 旁路,可调节,精度
输出电压: 2.495 V ~ 36 V
容差: ±1%
温度系数: 30ppm/°C
输入电压: 高达 36V
通道数: 1
电流 - 阴极: 500µA
电流 - 输出: 200mA
工作温度: -20°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
供应商设备封装: 8-SOP
包装: 带卷 (TR)
V DEV MAX MIN
AP431/AP431A
Electrical Characteristics (cont.) (@T A = +25°C, V DD = 3V; unless otherwise specified.)
V MAX
=V -V
V MIN
T1
Temperature
T2
Note: 6. Deviation of reference input voltage, V DEV , is defined as the maximum variation of the reference over the full temperature range.
The average temperature coefficient of the reference input voltage ? V REF is defined as:
α V REF
?
(
V DEV
V REF (25 ? C)
T 2 ? T 1
) ? 10 6
……………………..………..…………….. ( ppm
? C
)
Where:
T2 – T1 = full temperature change.
? V REF can be positive or negative depending on whether the slope is positive or negative.
Note:
7. The dynamic output impedance, R Z , is defined as:
Z KA ?
? V KA
? I KA
When the device is programmed with two external resistors R1 and R2 (see Figure 2.), the dynamic output impedance of the overall
circuit, is defined as:
Z KA ' ?
? v
? i
≈ Z KA
(1 ?
R1
R2
)
Test Conditions
?
Input
IN
IN
V REF
I KA
V KA
R1
R2
I REF
V REF
I KA
V KA
V KA
I Z(OFF)
Note: V KA REF (1 + R1/R2) + I REF xR1
=V
Figure. 1 Test Circuit for V KA REF
=V
AP431/AP431A
Document number: DS31002 Rev. 21 - 2
Figure. 2 Test Circuit for V KA > V REF
4 of 17
Figure. 3 Test Circuit for Off-State Current
June 2013
? Diodes Incorporated
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