参数资料
型号: APGDT002
厂商: Microchip Technology
文件页数: 11/12页
文件大小: 0K
描述: IC MICROCONTROLLER
标准包装: 1
工具类型: CAN 总线分析器
适用于相关产品: PC 至 CAN 通信
Commitment to the Relentless Quest for Perfection
“Quality Comes First” is at the top of the list of Guiding
Values for Microchip Technology. As an ISO/TS-16949
certified supplier since 2003, Microchip’s Aggregate
System uniquely supports our commitment to
exceptional quality. In an environment where enterprise
wide commitment to continuous improvement is
demonstrated and every employee is responsible for
quality.
Quality and Reliability
Part Submission Warrant
Microchip supports various automotive quality
initiatives:
? ? Zero Defect Initiatives
? ? APQP – Advanced Product/Process Quality Planning
? ? AEC-Q100 Stress Testing
? ? PPAP – Production Part Approval Process
? ? 8D Reporting
? ? Product Change Notification
AUTOMOTIVE PRODUCTS GROUP
8-D REPORT
Part Name
Shown on Drawing Number
Engineering Change Level
Cust. Part Number
Orig. Part Number
Dated
Additional Engineering Changes
N/A
Dated
N/A
DATE:
SUBJECT:
REVISION:
FA #:
August 28, 2007
defect VIA
A
C070816
Checking Aid Number Pb-Free Checking Aid Eng. Change Level N/A
ORGANIZATION MANUFACTURING INFORMATION CUSTOMER SUBMITTAL INFORMATION
Microchip Technology Inc.
Organization Name & Supplier/Vendor Code Customer Name/Division
Safety and/or Government Regulation Yes No Purchase Order No. N/A
Weight (kg)
Dated
N/A
N/A
AEC - Q100 - Rev-G
May 14, 2007
MICROCHIP P/N:
Trace Code:
MASK NO.:
24LC16B
06443WV
C5AR3
2355 W Chandler Blvd.
Street Address
Chandler Arizona
City Region
85224
Postal Code
USA
Country
Buyer/Buyer Code
Application
CUSTOMER:
TRW
MATERIALS REPORTING
Customer Part #:
Customer Tracking Number:
59141550
204115
Has customer-required Substances of Concern information been reported?
Submitted by IMDS or other customer format:
Are polymeric parts identified with appropriate ISO marking codes?
Node ID#
Yes
Yes
No
No
n/a
n/a
1. USE TEAM APPROACH:
REASON FOR SUBMISSION (Check at least one)
Initial submission
Engineering Change(s)
Change to Optional Construction or Material
Sub-Supplier or Material Source Change
- Yield Enhancement Engineering Manager
- Wafer Manufacturing Engineer
- Failure Analysis Engineer
Andy Birrell
Roger Melcher
Anupam Menghal
Craig Comeaux
Steve Vernier
- APG Quality Engineer REQUESTED SUBMISSION LEVEL (Check one)
- APG Product Engineer Level 3 - Warrant with product samples and complete supporting data submitted to customer.
Tooling: Transfer, Replacement, Refurbishment, or additional Change in Part Processing
Correction of Discrepancy Parts produced at Additional Location
Tooling Inactive > than 1 year Other - please specify
Level 1 - Warrant only (and for designated appearance items, an Appearance Approval Report) submitted to customer.
Level 2 - Warrant with product samples and limited supporting data submitted to customer.
FAILURE MECHANISM BASED
STRESS TEST QUALIFICATION
2. DESCRIBE PROBLEM:
Level 4 - Warrant and other requirements as defined by customer.
Level 5 - Warrant with product samples and complete supporting data reviewed at organization's manufacturing location.
SUBMISSION RESULTS
FOR
One 24LC16B device was returned when the customer reported that Mold / Cavity / Production Process
device is
The results for         dimensional measurements
These results meet all design record requirements:
N/A
during
failed in end user applications. The device failure has been confirmed DECLARATION
material and functional tests
Yes NO
appearance criteria statistical process package
(If "NO" - Explanation Required)
INTEGRATED CIRCUITS
bench testing as well as ATE testing. All the pins appeared normal during that initial Manual 4th Edition warrant are representative affirm our that these samples made by produced at that the meets all Production of
curve tracing. Bench testing revealed that the device was drawing abnormally hours. I also below. that documented evidence of such compliance is on file and available for your review. I have noted any
high current. It is also confirmed that the multiple addresses in array are flipping
I affirm the samples represented by this of parts, which were a process duction
Part Approval Process Requirements. I further were production rate
_N/A___/_N/A___ certify ted
deviation from this declaration
EXPLANATION/COMMENTS: PPAP#
with each read. The ATE testing also revealed that the returned unit may have
failed the parametric or functional tests.
Is each Customer Tool properly tagged and numbered?
Yes
No
n/a
Organization Authorized Signature
Date
Print Name
Title
Corporate Quality
Phone No.
E-mail
Fax No.
480-792-4317
FOR CUSTOMER USE ONLY (IF APPLICABLE)
PPAP Warrant Disposition:
Customer Signature
Print Name
Approved
Rejected
Other
Customer Tracking Number (optional)
Date
Automotive Electronics Council
Component Technical Committee
With nearly 20 years of experience in serving the demanding requirements of the automotive customer, Microchip
Technology has a proven track record of success in delivering the total product solution to our valued customers that
is cost effective and reliable.
Corporate Headquarters
Chandler, Arizona
Fab 2
Tempe, Arizona
Fab 4
Gresham, Oregon
Product Assembly/Test
Bangkok, Thailand
www.microchip.com/quality
11
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