AS7C256
AS7C256L
6
1. During V
CC
power-up, a pull-up resistor to V
CC
on CE is required to meet I
SB
specification.
2. This parameter is sampled and not 100% tested.
3. For test conditions, see
AC Test Conditions
, Figures A, B, C.
4. t
CLZ
and t
CHZ
are specified with CL = 5pF as in Figure C. Transition is measured
±
500mV from steady-state voltage.
5. This parameter is guaranteed but not tested.
6. WE is HIGH for read cycle.
7. CE and OE are LOW for read cycle.
8. Address valid prior to or coincident with CE transition LOW.
9. All read cycle timings are referenced from the last valid address to the first transitioning address.
10. CE or WE must be HIGH during address transitions.
11. All write cycle timings are referenced from the last valid address to the first transitioning address.
Parameter
Symbol
Test Conditions
Min
Max
Unit
V
CC
for Data Retention
Data Retention Current
V
DR
I
CCDR
t
CDR
t
R
|
I
LI
|
V
CC
= 2.0V
CE
≥
V
CC
–0.2V
V
in
≥
V
–0.2V
or
V
in
≤
0.2V
2.0
–
V
μ
A
–
150
Chip Enable to Data Retention Time
0
–
ns
Operation Recovery Time
t
RC
–
–
ns
μ
A
Input Leakage Current
1
DATA RETENTION CHARACTERISTICS
(L Version Only)
DATA RETENTION WAVEFORM
(L Version Only)
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AS7C256-07
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V
CC
CE
t
R
t
CDR
Data retention mode
4.5V
4.5V
V
DR
≥
2.0V
V
IH
V
IH
V
DR
AC TEST CONDITIONS
255
– Output load: see Figure B,
except for t
CLZ
and t
CHZ
see Figure C.
– Input pulse level: GND to 3.0V. See Figure A.
– Input rise and fall times: 5 ns. See Figure A.
– Input and output timing reference levels: 1.5V.
5 pF*
480
D
out
GND
+5V
168
Thevenin Equivalent:
D
out
+1.728V
Figure C: Output Load for t
CLZ
, t
CHZ
AS7C256-10
255
30 pF*
480
D
out
GND
+5V
Figure B: Output Load
AS7C256-09
*including scope
and jig capacitance
10%
90%
10%
90%
GND
+3.0V
Figure A: Input Waveform
AS7C256-08
NOTES