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参数资料
| 型号： | AT28C64X-25SI |
| 厂商： | Atmel |
| 文件页数： | 5/12页 |
| 文件大小： | 0K |
| 描述： | IC EEPROM 64KBIT 250NS 28SOIC |
| 标准包装： | 27 |
| 格式 - 存储器： | EEPROMs - 并行 |
| 存储器类型： | EEPROM |
| 存储容量： | 64K (8K x 8) |
| 速度： | 250ns |
| 接口： | 并联 |
| 电源电压： | 4.5 V ~ 5.5 V |
| 工作温度： | -40°C ~ 85°C |
| 封装/外壳： | 28-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装： | 28-SOIC W |
| 包装： | 管件 |
| 其它名称： | AT28C64X25SI |
AT28C64(X)
AC Read Characteristics
AT28C64-12
AT28C64-15
AT28C64-20
AT28C64-25
Symbol
Parameter
Min
Max
Min
Max
Min
Max
Min
Max
Units
t ACC
Address to Output Delay
120
150
200
250
ns
t CE
(1)
CE to Output Delay
120
150
200
250
ns
t OE
(2)
OE to Output Delay
10
60
10
70
10
80
10
100
ns
t DF
(3)(4)
CE or OE High to Output Float
0
45
0
50
0
55
0
60
ns
t OH
Output Hold from OE, CE or
Address, whichever occurred first
0
0
0
0
ns
AC Read Waveforms (1)(2)(3)(4)
Notes:
1. CE may be delayed up to t ACC - t CE after the address transition without impact on t ACC .
2. OE may be delayed up to t CE - t OE after the falling edge of CE without impact on t CE or by t ACC - t OE after an address change
without impact on t ACC .
3. t DF is specified from OE or CE whichever occurs first (C L = 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and
Measurement Level
t R , t F < 20 ns
Pin Capacitance
f = 1 MHz, T = 25 ° C (1)
Output Test Load
Symbol
C IN
C OUT
Typ
4
8
Max
6
12
Units
pF
pF
Conditions
V IN = 0V
V OUT = 0V
Note:
1. This parameter is characterized and is not 100% tested.
5
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相关代理商/技术参数 |
参数描述 |
|---|---|
| AT28C64X-25TC | 制造商:ATMEL 制造商全称:ATMEL Corporation 功能描述:64K (8K x 8) CMOS E2PROM |
| AT28C64X-25TI | 制造商:ATMEL 制造商全称:ATMEL Corporation 功能描述:64K 8K x 8 CMOS E2PROM |
| AT28C64X-30DM/883 | 制造商:Atmel Corporation 功能描述:8K X8 EEPROM WITH READT/BUSY - Rail/Tube |
| AT28C64X-30LM/883 | 制造商:Atmel Corporation 功能描述:8K X8 EEPROM WITH READT/BUSY - Rail/Tube |
| AT28C64X-35LM/883 | 制造商:Atmel Corporation 功能描述:8K X8 EEPROM WITH READT/BUSY - Rail/Tube |
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