AT89C51RD2 / AT89C51ED2 QualPack
2 Rev. 0 – 2003 July
1 Table of contents
1
TABLE OF CONTENTS.............................................................................................................................................2
2
GENERAL INFORMATION......................................................................................................................................3
3
TECHNOLOGY INFORMATION............................................................................................................................4
3.1
W
AFER
P
ROCESS
T
ECHNOLOGY
..............................................................................................................................4
3.2
P
RODUCT
D
ESIGN
...................................................................................................................................................5
3.3
D
EVICE CROSS SECTION
..........................................................................................................................................6
QUALIFICATION ......................................................................................................................................................7
4.1
Q
UALIFICATION
M
ETHODOLOGY
............................................................................................................................7
4.2
Q
UALIFICATION
T
EST
M
ETHODS
.............................................................................................................................8
4.3
W
AFER
L
EVEL
R
ELIABILITY
...................................................................................................................................9
4.3.1
Electromigration...............................................................................................................................................9
4.3.2
Hot Carriers Injection.....................................................................................................................................11
4.3.3
Time Dependent Dielectric Breakdown ............................................................................................................12
4.3.4
FLASH Characteristics....................................................................................................................................14
4.4
D
EVICE
R
ELIABILITY
............................................................................................................................................18
4.4.1
Operating Life Testing.....................................................................................................................................18
4.4.2
ESD / Latch-up................................................................................................................................................18
4.4.3
FLASH and EEPROM Data Retention and Endurance Cycling ........................................................................18
4.4.4
AT89C51ED2 Operating Reliability Calculation..............................................................................................20
4.5
AT89C51ED2 P
ACKAGING RELIABILITY
...............................................................................................................21
4.6
AT89C51ED2 Q
UALIFICATION STATUS
................................................................................................................21
ENVIRONMENTAL INFORMATION....................................................................................................................22
4
5
6
OTHER DATA ..........................................................................................................................................................23
6.1
ISO / TS16949 : 2002 C
ERTIFICATE
.....................................................................................................................23
6.2
D
ATA
B
OOK
R
EFERENCE
......................................................................................................................................24
6.3
R
EVISION
H
ISTORY
..............................................................................................................................................24