参数资料
| 型号： | ATF22LV10CQZ-30SC |
| 厂商： | Atmel |
| 文件页数： | 16/19页 |
| 文件大小： | 0K |
| 描述： | IC PLD EE 30NS "QZ" PWR 24-SOIC |
| 标准包装： | 31 |
| 系列： | 22V10 |
| 可编程类型： | EE PLD |
| 宏单元数： | 10 |
| 输入电压： | 3.3V |
| 速度： | 30ns |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 24-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装： | 24-SOIC W |
| 包装： | 管件 |
| 其它名称： | ATF22LV10CQZ30SC |
6
0779M–PLD–7/10
Atmel ATF22LV10C(Q)Z
4.4
Input Test Waveforms
4.4.1
Input Test Waveforms and Measurement Levels
4.4.2
Output Test Loads
Note:
Similar competitors devices are specified with slightly different loads. These load differences may affect output signals’
delay and slew rate. Atmel devices are tested with sufficient margins to meet compatible device specification
conditions
4.5
Pin Capacitance
Table 4-1.
Pin Capacitance (f = 1MHz,T=25
C(1))
Note:
1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested
4.6
Power-up Reset
The registers in the Atmel ATF22LV10CZ/CQZ are designed to reset during power-up. At a point delayed slightly
from V
CC crossing VRST, all registers will be reset to the low state. The output state will depend on the polarity of the
buffer.
This feature is critical for state machine initialization. However, due to the asynchronous nature of reset and the
uncertainty of how V
CC actually rises in the system, the following conditions are required:
1.
The V
CC rise must be monotonic and start below 0.7V
2.
The clock must remain stable during T
PR
3.
After T
PR, all input and feedback setup times must be met before driving the clock pin high
4.7
Preload of Register Outputs
The ATF22LV10CZ/CQZ’s registers are provided with circuitry to allow loading of each register with either a high or
a low. This feature will simplify testing since any state can be forced into the registers to control test sequencing. A
JEDEC file with preload is generated when a source file with vectors is compiled. Once downloaded, the JEDEC
file preload sequence will be done automatically by most of the approved programmers after the programming.
Typ
Max
Units
Conditions
C
IN
5
8
pF
V
IN =0V
C
I/O
6
8
pF
V
OUT =0V
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相关代理商/技术参数 |
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| ATF22LV10CQZ-30SI | 功能描述:SPLD - 简单可编程逻辑器件 EEPLD 500 GATE 3.3 5V PWR 30NS IND TEMP RoHS:否 制造商:Texas Instruments 逻辑系列:TICPAL22V10Z 大电池数量:10 最大工作频率:66 MHz 延迟时间:25 ns 工作电源电压:4.75 V to 5.25 V 电源电流:100 uA 最大工作温度:+ 75 C 最小工作温度:0 C 安装风格:Through Hole 封装 / 箱体:DIP-24 |
| ATF22LV10CQZ-30SU | 功能描述:SPLD - 简单可编程逻辑器件 500 GT 3.3-5V SPLY ZERO/QRTR PWR-30NS RoHS:否 制造商:Texas Instruments 逻辑系列:TICPAL22V10Z 大电池数量:10 最大工作频率:66 MHz 延迟时间:25 ns 工作电源电压:4.75 V to 5.25 V 电源电流:100 uA 最大工作温度:+ 75 C 最小工作温度:0 C 安装风格:Through Hole 封装 / 箱体:DIP-24 |
| ATF22LV10CQZ-30XC | 功能描述:SPLD - 简单可编程逻辑器件 500 GT 3.3-5V SPLY ZERO/QRTR PWR-30NS RoHS:否 制造商:Texas Instruments 逻辑系列:TICPAL22V10Z 大电池数量:10 最大工作频率:66 MHz 延迟时间:25 ns 工作电源电压:4.75 V to 5.25 V 电源电流:100 uA 最大工作温度:+ 75 C 最小工作温度:0 C 安装风格:Through Hole 封装 / 箱体:DIP-24 |
| ATF22LV10CQZ-30XI | 功能描述:SPLD - 简单可编程逻辑器件 500 GT 3.3-5V SPLY ZERO/QRTR PWR-30NS RoHS:否 制造商:Texas Instruments 逻辑系列:TICPAL22V10Z 大电池数量:10 最大工作频率:66 MHz 延迟时间:25 ns 工作电源电压:4.75 V to 5.25 V 电源电流:100 uA 最大工作温度:+ 75 C 最小工作温度:0 C 安装风格:Through Hole 封装 / 箱体:DIP-24 |
| ATF22LV10CQZ-30XU | 功能描述:SPLD - 简单可编程逻辑器件 30 ns 24 I/O Pins 10 macorcells 10 reg RoHS:否 制造商:Texas Instruments 逻辑系列:TICPAL22V10Z 大电池数量:10 最大工作频率:66 MHz 延迟时间:25 ns 工作电源电压:4.75 V to 5.25 V 电源电流:100 uA 最大工作温度:+ 75 C 最小工作温度:0 C 安装风格:Through Hole 封装 / 箱体:DIP-24 |
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