参数资料
型号: ATF22LV10CZ-25JC
厂商: Atmel
文件页数: 16/19页
文件大小: 0K
描述: IC PLD 25NS 28PLCC
标准包装: 38
系列: 22V10
可编程类型: EE PLD
宏单元数: 10
输入电压: 3.3V
速度: 25ns
安装类型: 表面贴装
封装/外壳: 28-LCC(J 形引线)
供应商设备封装: 28-PLCC(11.51x11.51)
包装: 管件
其它名称: ATF22LV10CZ25JC
6
0779M–PLD–7/10
Atmel ATF22LV10C(Q)Z
4.4
Input Test Waveforms
4.4.1
Input Test Waveforms and Measurement Levels
4.4.2
Output Test Loads
Note:
Similar competitors devices are specified with slightly different loads. These load differences may affect output signals’
delay and slew rate. Atmel devices are tested with sufficient margins to meet compatible device specification
conditions
4.5
Pin Capacitance
Table 4-1.
Pin Capacitance (f = 1MHz,T=25
C(1))
Note:
1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested
4.6
Power-up Reset
The registers in the Atmel ATF22LV10CZ/CQZ are designed to reset during power-up. At a point delayed slightly
from V
CC crossing VRST, all registers will be reset to the low state. The output state will depend on the polarity of the
buffer.
This feature is critical for state machine initialization. However, due to the asynchronous nature of reset and the
uncertainty of how V
CC actually rises in the system, the following conditions are required:
1.
The V
CC rise must be monotonic and start below 0.7V
2.
The clock must remain stable during T
PR
3.
After T
PR, all input and feedback setup times must be met before driving the clock pin high
4.7
Preload of Register Outputs
The ATF22LV10CZ/CQZ’s registers are provided with circuitry to allow loading of each register with either a high or
a low. This feature will simplify testing since any state can be forced into the registers to control test sequencing. A
JEDEC file with preload is generated when a source file with vectors is compiled. Once downloaded, the JEDEC
file preload sequence will be done automatically by most of the approved programmers after the programming.
Typ
Max
Units
Conditions
C
IN
5
8
pF
V
IN =0V
C
I/O
6
8
pF
V
OUT =0V
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ATF22LV10CZ-25JI 功能描述:SPLD - 简单可编程逻辑器件 EEPLD 500GATE 3.3V 5V PWR 25NS IND TEMP RoHS:否 制造商:Texas Instruments 逻辑系列:TICPAL22V10Z 大电池数量:10 最大工作频率:66 MHz 延迟时间:25 ns 工作电源电压:4.75 V to 5.25 V 电源电流:100 uA 最大工作温度:+ 75 C 最小工作温度:0 C 安装风格:Through Hole 封装 / 箱体:DIP-24
ATF22LV10CZ-25PC 功能描述:SPLD - 简单可编程逻辑器件 500 GATE 3.3V-5V SPLY ZERO PWR-25NS RoHS:否 制造商:Texas Instruments 逻辑系列:TICPAL22V10Z 大电池数量:10 最大工作频率:66 MHz 延迟时间:25 ns 工作电源电压:4.75 V to 5.25 V 电源电流:100 uA 最大工作温度:+ 75 C 最小工作温度:0 C 安装风格:Through Hole 封装 / 箱体:DIP-24
ATF22LV10CZ-25PI 功能描述:SPLD - 简单可编程逻辑器件 EEPLD 500GATE 3.3V 5V PWR 25NS IND TEMP RoHS:否 制造商:Texas Instruments 逻辑系列:TICPAL22V10Z 大电池数量:10 最大工作频率:66 MHz 延迟时间:25 ns 工作电源电压:4.75 V to 5.25 V 电源电流:100 uA 最大工作温度:+ 75 C 最小工作温度:0 C 安装风格:Through Hole 封装 / 箱体:DIP-24
ATF22LV10CZ-25SC 功能描述:SPLD - 简单可编程逻辑器件 500 GATE 3.3V-5V SPLY ZERO PWR-25NS RoHS:否 制造商:Texas Instruments 逻辑系列:TICPAL22V10Z 大电池数量:10 最大工作频率:66 MHz 延迟时间:25 ns 工作电源电压:4.75 V to 5.25 V 电源电流:100 uA 最大工作温度:+ 75 C 最小工作温度:0 C 安装风格:Through Hole 封装 / 箱体:DIP-24
ATF22LV10CZ-25SI 功能描述:SPLD - 简单可编程逻辑器件 EEPLD 500GATE 3.3V 5V PWR 25NS IND TEMP RoHS:否 制造商:Texas Instruments 逻辑系列:TICPAL22V10Z 大电池数量:10 最大工作频率:66 MHz 延迟时间:25 ns 工作电源电压:4.75 V to 5.25 V 电源电流:100 uA 最大工作温度:+ 75 C 最小工作温度:0 C 安装风格:Through Hole 封装 / 箱体:DIP-24